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MPC5607B Microcontroller Data Sheet, Rev. 6
Electrical characteristics
Freescale Semiconductor
80
RSW1
CC D Internal resistance of analog
source
——
—
3
k
RSW2
CC D Internal resistance of analog
source
—
2
k
RAD
CC D Internal resistance of analog
source
——
—
2
k
IINJ
SR — Input current Injection
Current injection
on one ADC_0
input, different
from the
converted one
VDD =
3.3 V ± 10%
5—
5
mA
VDD =
5.0 V ± 10%
5
—
5
| INL |
CC T Absolute integral nonlinearity
No overload
—
0.5
1.5
LSB
| DNL |
CC T Absolute differential
nonlinearity
No overload
—
0.5
1.0
LSB
| EO |
CC T Absolute offset error
—
0.5
—
LSB
| EG |
CC T Absolute gain error
——
0.6
—
LSB
TUEP
CC P Total unadjusted error7 for
precise channels, input only
pins
Without current injection
2
0.6
2
LSB
T
With current injection
3
—
3
TUEX
CC T Total unadjusted error
7 for
extended channel
Without current injection
3
1
3
LSB
T
With current injection
4
1 V
DD = 3.3 V ± 10% / 5.0 V ± 10%, TA = 40 to 125 °C, unless otherwise specified.
2 Analog and digital V
SS must be common (to be tied together externally).
3 V
AINx may exceed VSS_ADC0 and VDD_ADC0 limits, remaining on absolute maximum ratings, but the results of the
conversion will be clamped respectively to 0x000 or 0x3FF.
4 Duty cycle is ensured by using system clock without prescaling. When ADCLKSEL = 0, the duty cycle is ensured
by internal divider by 2.
5 During the sampling time the input capacitance C
S can be charged/discharged by the external source. The internal
resistance of the analog source must allow the capacitance to reach its final voltage level within tADC0_S. After the
end of the sampling time tADC0_S, changes of the analog input voltage have no effect on the conversion result.
Values for the sampling clock tADC0_S depend on programming.
6 This parameter does not include the sampling time t
ADC0_S, but only the time for determining the digital result and
the time to load the result’s register with the conversion result.
7 Total Unadjusted Error: The maximum error that occurs without adjusting Offset and Gain errors. This error is a
combination of Offset, Gain and Integral Linearity errors.
Table 44. ADC_0 conversion characteristics (10-bit ADC_0) (continued)
Symbol
C
Parameter
Conditions1
Value
Unit
Min
Typ
Max