參數(shù)資料
型號: MN54AC2525-X
廠商: National Semiconductor Corporation
英文描述: MN54AC2525-X REV 1B0
中文描述: MN54AC2525 - X活1B0
文件頁數(shù): 6/6頁
文件大?。?/td> 15K
代理商: MN54AC2525-X
MN54AC2525-X REV 1B0
MICROCIRCUIT DATA SHEET
Electrical Characteristics
AC PARAMETERS(Continued)
(The following conditions apply to all the following parameters, unless otherwise specified.)
AC:
CL=50pf, Rl=500 Ohms, TR=3.0V, TF=3.0V, Temp Range:-55C to 125C. NOTE: -55C TEMPERATURE, SUBGROUP 11
IS GUARANTEED BUT NOT TESTED.
SYMBOL
PARAMETER
CONDITIONS
NOTES
PIN-
NAME
MIN
MAX
UNIT
SUB-
GROUPS
tpLH(2)
Propagation Delay
VCC=3.0V
3,
4, 7
CKIN-On 4.0
9.5
ns
9
3,
4, 7
CKIN-On 5.0
11.0
ns
10
3,
4, 7
CKIN-On 3.0
8.5
ns
11
tosHL(2)
Maximum Skew
Common Edge
Output to Output
VCC=3.0V
6
On-On
Skew
1.5
ns
9, 10,
11
tosLH(2)
Maximum Skew
Common Edge
Output to Output
VCC=3.0V
6
On-On
Skew
1.5
ns
9, 10,
11
tost(2)
Maximum Skew
Opposite Edge
Output to Output
VCC=3.0V
6
Opposit
e Skew
Edge
1.5
ns
9, 10,
11
Note 1:
SCREEN TESTED 100% ON EACH DEVICE AT +25C & +125C TEMPERATURE, SUBGROUPS 1, 2, 7, &
8.
SAMPLE TESTED (METHOD 5005, TABLE 1) ON EACH MFG. LOT AT +25C & +125C TEMPERATURE,
SUBGROUPS A1, 2, 7, & 8.
SCREEN TESTED 100% ON EACH DEVICE AT +25C TEMPERATURE ONLY, SUBGROUP A9.
SAMPLE TESTED (METHOD 5005, TABLE 1) ON EACH MFG. LOT AT +25C & +125C TEMPERATURE,
SUBGROUPS A9 & 10.
TRANSMISSION LINE DRIVING TEST, GUARDBAND LIMITS SET FOR +25C, 2 MSEC DURATION MAX.
DESIGN CHARACTERIZATION DATA ONLY
+25C & +125C MIN LIMITS GUARANTEED FOR 5.5V BY GUARDBANDING 4.5V MIN. LIMITS.
Note 2:
Note 3:
Note 4:
Note 5:
Note 6:
Note 7:
6
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