For most applications, PI/O P
參數(shù)資料
型號(hào): MCF51MM256VML
廠商: Freescale Semiconductor
文件頁(yè)數(shù): 10/57頁(yè)
文件大?。?/td> 0K
描述: IC MCU 32BIT 256K COLDF 104-PBGA
標(biāo)準(zhǔn)包裝: 240
系列: MCF51MM
核心處理器: Coldfire V1
芯體尺寸: 32-位
速度: 50MHz
連通性: CAN,EBI/EMI,I²C,SCI,SPI,USB OTG
外圍設(shè)備: LVD,PWM,WDT
輸入/輸出數(shù): 69
程序存儲(chǔ)器容量: 256KB(256K x 8)
程序存儲(chǔ)器類型: 閃存
RAM 容量: 32K x 8
電壓 - 電源 (Vcc/Vdd): 1.8 V ~ 3.6 V
數(shù)據(jù)轉(zhuǎn)換器: A/D 8x16b,D/A 1x12b
振蕩器型: 外部
工作溫度: -40°C ~ 105°C
封裝/外殼: 104-LFBGA
包裝: 管件
Electrical Characteristics
Freescale Semiconductor
18
For most applications, PI/O Pint and can be neglected. An approximate relationship between PD and TJ
(if PI/O is neglected) is:
PD = K (TJ + 273C)
Eqn. 2
Solving Equation 1 and Equation 2 for K gives:
K = PD (TA + 273C) + JA (PD)2
Eqn. 3
where K is a constant pertaining to the particular part. K can be determined from Equation 3 by measuring
PD (at equilibrium) for a known TA. Using this value of K, the values of PD and TJ can be obtained by
solving Equation 1 and Equation 2 iteratively for any value of TA.
3.4
ESD Protection Characteristics
Although damage from static discharge is much less common on these devices than on early CMOS
circuits, normal handling precautions should be used to avoid exposure to static discharge. Qualification
tests are performed to ensure that these devices can withstand exposure to reasonable levels of static
without suffering any permanent damage.
All ESD testing is in conformity with CDF-AEC-Q00 Stress Test Qualification for Automotive Grade
Integrated Circuits. (http://www.aecouncil.com/) This device was qualified to AEC-Q100 Rev E.
A device is considered to have failed if, after exposure to ESD pulses, the device no longer meets the
device specification requirements. Complete dc parametric and functional testing is performed per the
applicable device specification at room temperature followed by hot temperature, unless specified
otherwise in the device specification.
Table 7. ESD and Latch-up Test Conditions
Model
Description
Symbol
Value
Unit
Human Body
Series Resistance
R1
1500
Storage Capacitance
C
100
pF
Number of Pulse per pin
3
Machine
Series Resistance
R1
0
Storage Capacitance
C
200
pF
Number of Pulse per pin
3
Latch-up
Minimum input voltage limit
–2.5
V
Maximum input voltage limit
7.5
V
Table 8. ESD and Latch-Up Protection Characteristics
#
Rating
Symbol
Min
Max
Unit
C
1
Human Body Model (HBM)
VHBM
2000
V
T
2
Machine Model (MM)
VMM
200
V
T
MCF51MM256/128, Rev. 5
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MCF51MM256VMLJ 功能描述:32位微控制器 - MCU 32BIT 256K FLASH RoHS:否 制造商:Texas Instruments 核心:C28x 處理器系列:TMS320F28x 數(shù)據(jù)總線寬度:32 bit 最大時(shí)鐘頻率:90 MHz 程序存儲(chǔ)器大小:64 KB 數(shù)據(jù) RAM 大小:26 KB 片上 ADC:Yes 工作電源電壓:2.97 V to 3.63 V 工作溫度范圍:- 40 C to + 105 C 封裝 / 箱體:LQFP-80 安裝風(fēng)格:SMD/SMT
MCF51QE128 制造商:FREESCALE 制造商全稱:Freescale Semiconductor, Inc 功能描述:32-Bit Version 1 ColdFire㈢ Central Processor Unit (CPU)
MCF51QE128_08 制造商:FREESCALE 制造商全稱:Freescale Semiconductor, Inc 功能描述:32-Bit Version 1 ColdFire㈢ Central Processor Unit (CPU)
MCF51QE128CLH 功能描述:32位微控制器 - MCU Flexis Series 32 Bit 128K FLASH RoHS:否 制造商:Texas Instruments 核心:C28x 處理器系列:TMS320F28x 數(shù)據(jù)總線寬度:32 bit 最大時(shí)鐘頻率:90 MHz 程序存儲(chǔ)器大小:64 KB 數(shù)據(jù) RAM 大小:26 KB 片上 ADC:Yes 工作電源電壓:2.97 V to 3.63 V 工作溫度范圍:- 40 C to + 105 C 封裝 / 箱體:LQFP-80 安裝風(fēng)格:SMD/SMT
MCF51QE128CLK 功能描述:32位微控制器 - MCU Flexis Series 32 Bit 128K FLASH RoHS:否 制造商:Texas Instruments 核心:C28x 處理器系列:TMS320F28x 數(shù)據(jù)總線寬度:32 bit 最大時(shí)鐘頻率:90 MHz 程序存儲(chǔ)器大小:64 KB 數(shù)據(jù) RAM 大小:26 KB 片上 ADC:Yes 工作電源電壓:2.97 V to 3.63 V 工作溫度范圍:- 40 C to + 105 C 封裝 / 箱體:LQFP-80 安裝風(fēng)格:SMD/SMT