
Appendix A Electrical Characteristics
MC9S12XDP512 Data Sheet, Rev. 2.21
1256
Freescale Semiconductor
A.2.3
ATD Accuracy
A.2.3.1
5-V Range
Table A-15 species the ATD conversion performance excluding any errors due to current injection, input
capacitance, and source resistance.
A.2.3.2
3.3-V Range
Table A-16 species the ATD conversion performance excluding any errors due to current injection, input
capacitance, and source resistance.
Table A-15. 5-V ATD Conversion Performance
Conditions are shown in
Table A-4 unless otherwise noted
VREF = VRH–VRL = 5.12 V. Resulting to one 8-bit count = 20 mV and one 10-bit count = 5 mV
fATDCLK = 2.0 MHz
Num
C
Rating
Symbol
Min
Typ
Max
Unit
1
P 10-bit resolution
LSB
—
5
—
mV
2
P 10-bit differential nonlinearity
DNL
–1
—
1
Counts
3
P 10-bit integral nonlinearity
INL
–2.5
±1.5
2.5
Counts
4
P 10-bit absolute error1
1 These values include the quantization error which is inherently 1/2 count for any A/D converter.
AE
–3
±2.0
3
Counts
5
P 8-bit resolution
LSB
—
20
—
mV
6
P 8-bit differential nonlinearity
DNL
–0.5
—
0.5
Counts
7
P 8-bit integral nonlinearity
INL
–1.0
±0.5
1.0
Counts
8
P 8-bit absolute error1
AE
–1.5
±1.0
1.5
Counts
Table A-16. 3.3-V ATD Conversion Performance
Conditions are shown in
Table A-4 unless otherwise noted
VREF = VRH–VRL = 3.328 V. Resulting to one 8-bit count = 13mV and one 10-bit count = 3.25 mV
fATDCLK = 2.0 MHz
Num
C
Rating
Symbol
Min
Typ
Max
Unit
1
P 10-bit resolution
LSB
—
3.25
—
mV
2
P 10-bit differential nonlinearity
DNL
–1.5
—
1.5
Counts
3
P 10-bit integral nonlinearity
INL
–3.5
±1.5
3.5
Counts
4
P 10-bit absolute error1
1 These values include the quantization error which is inherently 1/2 count for any A/D converter.
AE
–5
±2.5
5
Counts
5
P 8-bit resolution
LSB
—
13
—
mV
6
P 8-bit differential nonlinearity
DNL
–0.5
—
0.5
Counts
7
P 8-bit integral nonlinearity
INL
–1.5
±1.0
1.5
Counts
8
P 8-bit absolute error1
AE
–2.0
±1.5
2.0
Counts