參數(shù)資料
型號: MC74LVX50DTR2
廠商: ON SEMICONDUCTOR
元件分類: 通用總線功能
英文描述: HEX BUFFER
中文描述: LV/LV-A/LVX/H SERIES, HEX 1-INPUT NON-INVERT GATE, PDSO14
封裝: LEAD FREE, TSSOP-14
文件頁數(shù): 3/10頁
文件大小: 153K
代理商: MC74LVX50DTR2
MC74LVX50
http://onsemi.com
3
MAXIMUM RATINGS
Symbol
Parameter
Value
Unit
V
CC
DC Supply Voltage
0.5 to
7.0
V
V
IN
DC Input Voltage
0.5 to
7.0
V
V
OUT
DC Output Voltage
0.5 to V
CC
0.5
V
I
IK
DC Input Diode Current
V
I
< GND
20
mA
I
OK
DC Output Diode Current
V
O
< GND
20
mA
I
OUT
DC Output Sink Current
25
mA
I
CC
DC Supply Current per Supply Pin
50
mA
T
STG
Storage Temperature Range
65 to
150
C
T
L
Lead Temperature, 1 mm from Case for 10 Seconds
260
C
T
J
Junction Temperature under Bias
150
C
JA
Thermal Resistance
(Note 1)
SOIC
TSSOP
125
170
C/W
MSL
Moisture Sensitivity
Level 1
F
R
Flammability Rating
Oxygen Index: 30% 35%
UL 94V0 @ 0.125 in
V
ESD
ESD Withstand Voltage
Human Body Model (Note 2)
Machine Model (Note 3)
Charged Device Model (Note 4)
> 2000
> 200
2000
V
I
Latchup
Maximum ratings are those values beyond which device damage can occur. Maximum ratings applied to the device are individual stress limit
values (not normal operating conditions) and are not valid simultaneously. If these limits are exceeded, device functional operation is not implied,
damage may occur and reliability may be affected.
1. Measured with minimum pad spacing on an FR4 board, using 10 mmby1 inch, 2ounce copper trace with no air flow.
2. Tested to EIA/JESD22A114A.
3. Tested to EIA/JESD22A115A.
4. Tested to JESD22C101A.
5. Tested to EIA/JESD78.
Latchup Performance
Above V
CC
and Below GND at 85 C (Note 5)
300
mA
RECOMMENDED OPERATING CONDITIONS
Symbol
Parameter
Min
Max
Unit
V
CC
Supply Voltage
2.0
3.6
V
V
I
Input Voltage
(Note 6)
0
5.5
V
V
O
Output Voltage
(HIGH or LOW State)
0
V
CC
V
T
A
Operating FreeAir Temperature
40
85
C
t/ V
Input Transition Rise or Fall Rate
V
CC
= 3.0 V
0.3 V
0
100
ns/V
6. Unused inputs may not be left open. All inputs must be tied to a high or lowlogic input voltage level.
NOTE:
The
JA
of the package is equal to 1/Derating. Higher junction temperatures may affect the expected lifetime of the device per the table
and figure below.
相關(guān)PDF資料
PDF描述
MC74LVX50M HEX BUFFER
MC74LVX50MEL HEX BUFFER
MC74LVX50MELG HEX BUFFER
MC74LVX50MG HEX BUFFER
MC74LVX50D HEX BUFFER
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