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參數(shù)資料
| 型號： | MAX5864ETM+ |
| 廠商： | Maxim Integrated Products |
| 文件頁數(shù)： | 16/26頁 |
| 文件大?。?/td> | 0K |
| 描述： | IC ANLG FRONT END 22MSPS 48-TQFN |
| 產(chǎn)品培訓模塊： | Lead (SnPb) Finish for COTS Obsolescence Mitigation Program |
| 標準包裝： | 43 |
| 位數(shù)： | 10 |
| 通道數(shù)： | 4 |
| 功率（瓦特）： | 2.10W |
| 電壓 - 電源，模擬： | 2.7 V ~ 3.3 V |
| 電壓 - 電源，數(shù)字： | 1.8 V ~ 3.3 V |
| 封裝/外殼： | 48-WFQFN 裸露焊盤 |
| 供應商設備封裝： | 48-TQFN-EP（7x7） |
| 包裝： | 管件 |
MAX5864
Ultra-Low-Power, High Dynamic-
Performance, 22Msps Analog Front End
Dynamic Parameter Definitions
ADC and DAC Static Parameter Definitions
Integral Nonlinearity (INL)
Integral nonlinearity is the deviation of the values on an
actual transfer function from a straight line. This straight
line can be either a best-straight-line fit or a line drawn
between the end points of the transfer function, once
offset and gain errors have been nullified. The static lin-
earity parameters for the device are measured using
the end-point method (DAC Figure 12a).
Differential Nonlinearity (DNL)
Differential nonlinearity is the difference between an
actual step width and the ideal value of 1 LSB. A DNL
error specification of less than 1 LSB guarantees no
missing codes (ADC) and a monotonic transfer function
(ADC and DAC) (DAC Figure 12b).
ADC Offset Error
Ideally, the midscale transition occurs at 0.5 LSB above
midscale. The offset error is the amount of deviation
between the measured transition point and the ideal
transition point.
DAC Offset Error
Offset error (Figure 12a) is the difference between the
ideal and actual offset point. The offset point is the out-
put value when the digital input is midscale. This error
affects all codes by the same amount and usually can
be compensated by trimming.
ADC Gain Error
Ideally, the ADC full-scale transition occurs at 1.5 LSB
below full scale. The gain error is the amount of devia-
tion between the measured transition point and the
ideal transition point with the offset error removed.
ADC Dynamic Parameter Definitions
Aperture Jitter
Figure 13 depicts the aperture jitter (tAJ), which is the
sample-to-sample variation in the aperture delay.
Aperture Delay
Aperture delay (tAD) is the time defined between the
rising edge of the sampling clock and the instant when
an actual sample is taken (Figure 13).
Signal-to-Noise Ratio (SNR)
For a waveform perfectly reconstructed from digital
samples, the theoretical maximum SNR is the ratio of
the full-scale analog input (RMS value) to the RMS
quantization error (residual error) and results directly
from the ADC’s resolution (N bits):
SNR(max) = 6.02dB x N + 1.76dB (in dB)
In reality, there are other noise sources besides quanti-
zation noise: thermal noise, reference noise, clock jitter,
etc. SNR is computed by taking the ratio of the RMS
signal to the RMS noise. RMS noise includes all spec-
tral components to the Nyquist frequency excluding the
fundamental, the first five harmonics, and the DC offset.
Signal-to-Noise Plus Distortion (SINAD)
SINAD is computed by taking the ratio of the RMS sig-
nal to the RMS noise. RMS noise includes all spectral
components to the Nyquist frequency excluding the
fundamental and the DC offset.
Effective Number of Bits (ENOB)
ENOB specifies the dynamic performance of an ADC at a
specific input frequency and sampling rate. An ideal
ADC’s error consists of quantization noise only. ENOB for
a full-scale sinusoidal input waveform is computed from:
ENOB = (SINAD - 1. 76) / 6.02
Total Harmonic Distortion (THD)
THD is typically the ratio of the RMS sum of the first five
harmonics of the input signal to the fundamental itself.
This is expressed as:
where V1 is the fundamental amplitude and V2–V6 are
the amplitudes of the 2nd- through 6th-order harmonics.
THD
(V +V +V +V +V )
V
2
3
2
4
2
5
2
6
2
1
=
20log
HOLD
ANALOG
INPUT
SAMPLED
DATA (T/H)
T/H
tAD
tAJ
TRACK
CLK
Figure 13. T/H Aperture Timing
______________________________________________________________________________________
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相關代理商/技術參數(shù) |
參數(shù)描述 |
|---|---|
| MAX5864ETM+ | 功能描述:ADC / DAC多通道 10-Bit 2Ch 22Msps CODEC/AFE RoHS:否 制造商:Texas Instruments 轉(zhuǎn)換速率: 分辨率:8 bit 接口類型:SPI 電壓參考: 電源電壓-最大:3.6 V 電源電壓-最小:2 V 最大工作溫度:+ 85 C 安裝風格:SMD/SMT 封裝 / 箱體:VQFN-40 |
| MAX5864ETM+T | 功能描述:ADC / DAC多通道 10-Bit 2Ch 22Msps CODEC/AFE RoHS:否 制造商:Texas Instruments 轉(zhuǎn)換速率: 分辨率:8 bit 接口類型:SPI 電壓參考: 電源電壓-最大:3.6 V 電源電壓-最小:2 V 最大工作溫度:+ 85 C 安裝風格:SMD/SMT 封裝 / 箱體:VQFN-40 |
| MAX5864ETM-T | 功能描述:ADC / DAC多通道 RoHS:否 制造商:Texas Instruments 轉(zhuǎn)換速率: 分辨率:8 bit 接口類型:SPI 電壓參考: 電源電壓-最大:3.6 V 電源電壓-最小:2 V 最大工作溫度:+ 85 C 安裝風格:SMD/SMT 封裝 / 箱體:VQFN-40 |
| MAX5865ETM | 功能描述:ADC / DAC多通道 RoHS:否 制造商:Texas Instruments 轉(zhuǎn)換速率: 分辨率:8 bit 接口類型:SPI 電壓參考: 電源電壓-最大:3.6 V 電源電壓-最小:2 V 最大工作溫度:+ 85 C 安裝風格:SMD/SMT 封裝 / 箱體:VQFN-40 |
| MAX5865ETM+ | 功能描述:ADC / DAC多通道 10-Bit 2Ch 40Msps CODEC/AFE RoHS:否 制造商:Texas Instruments 轉(zhuǎn)換速率: 分辨率:8 bit 接口類型:SPI 電壓參考: 電源電壓-最大:3.6 V 電源電壓-最小:2 V 最大工作溫度:+ 85 C 安裝風格:SMD/SMT 封裝 / 箱體:VQFN-40 |
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