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參數(shù)資料
| 型號(hào)： | MAX5013BEPI |
| 廠商： | MAXIM INTEGRATED PRODUCTS INC |
| 元件分類： | DAC |
| 英文描述： | 12-Bit, 100Msps TTL DAC |
| 中文描述： | PARALLEL, WORD INPUT LOADING, 0.013 us SETTLING TIME, 12-BIT DAC, PDIP28 |
| 封裝： | 0.300 INCH, PLASTIC, DIP-28 |
| 文件頁(yè)數(shù)： | 4/8頁(yè) |
| 文件大?。?/td> | 96K |
| 代理商： | MAX5013BEPI |
M
12-Bit, 100Msps T T L DAC
4
_______________________________________________________________________________________
NAME
D2–D11
D12 (LSB)
FUNCTION
1–10
11
Digital Input Bits 2–11
Digital Input Bit 12 (LSB)
PIN
13
14
Analog Return
I
OUT
Analog V
EE
I
OUT
Ref In
Control Amp Out
Analog Return Ground
Analog Current Output
Analog Negative Supply (-5.2V)
Complementary Analog Current Output
Voltage Reference Input
Output of Internal Control Amplifier. Control Amp Out is normally connected to Ref In.
12, 21
Digital V
EE
Digital Negative Supply (-5.2V)
Pin Desc ription
15, 25
16
17
18
20
22
Ref Out
Ref GND
Internal Voltage Reference Output. Ref Out is normally connected to Control Amp In.
Ground return for internal voltage reference and amplifier.
19
Control Amp In
Normally connected to Ref Out if not connected to external reference.
26
27
Latch Enable
DGND
Latch-Control Line
Digital Ground Return
24
R
SET
*
Connection for external resistance reference when using internal amplifier (nominally 7.5k
).
23
Digital V
CC
Digital Positive Supply (+5.0V)
28
D1 (MSB)
Digital Input Bit 1 (MSB)
*Full-Scale Current Out = 128 (Control Amp In / R
SET
).
TEST LEVEL CODES
TEST LEVEL
TEST PROCEDURE
100% production tested at the specified temperature.
100% production tested at T
A
= +25°C, and sample
tested at the specified temperatures.
QA sample tested only at the specified temperatures.
Parameter is guaranteed (but not tested) by design and
characterization data.
Parameter is a typical value for information purposes only.
100% production tested at T
A
= +25°C. Parameter is
guaranteed over specified temperature range.
All electrical characteristics are subject to the following
conditions:
All parameters having min/max specifications are guar-
anteed. The Test Level column indicates the specific
device testing actually performed during production
and Quality Assurance inspection. Any black section in
the data column indicates that the specification is not
tested at the specified condition.
I
II
III
IV
V
VI
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