參數(shù)資料
型號: MAX3950EGK
廠商: MAXIM INTEGRATED PRODUCTS INC
元件分類: 數(shù)字傳輸電路
英文描述: PWR SPLY EXT MED 25W 5V @ 5A
中文描述: SERIAL TO PARALLEL/PARALLEL TO SERIAL CONVERTER, QCC68
封裝: 10 X 10 MM, 0.90 MM HEIGHT, QFN-68
文件頁數(shù): 4/7頁
文件大?。?/td> 163K
代理商: MAX3950EGK
V. Quality Assurance Information
A. Quality Assurance Contacts: Jim Pedicord
B. Outgoing Inspection Level: 0.1% for all electrical parameters guaranteed by the Datasheet.
0.1% For all Visual Defects.
C. Observed Outgoing Defect Rate: < 50 ppm
D. Sampling Plan: Mil-Std-105D
VI. Reliability Evaluation
A. Accelerated Life Test
The results of the 150
°
C biased (static) life test are shown in
Table 1
. Using these results, the Failure Rate
(
λ
) is calculated as follows:
λ
= 1 = 1.83 (Chi square value for MTTF upper limit)
MTTF
192 x 9823 x 135 x 2
Temperature Acceleration factor assuming an activation energy of 0.8eV
λ
= 3.59 x 10
-8
λ
= 3.59 F.I.T. (60% confidence level @ 25
°
C)
This low failure rate represents data collected from Maxim’s reliability qualification and monitor programs.
Maxim also performs weekly Burn-In on samples from production to assure reliability of its processes. The reliability
required for lots which receive a burn-in qualification is 59 F.I.T. at a 60% confidence level, which equates to 3 failures
in an 80 piece sample. Maxim performs failure analysis on rejects from lots exceeding this level. The Burn-In
Schematic (Spec.# 06-6948) shows the static circuit used for this test. Maxim also performs 1000 hour life test
monitors quarterly for each process. This data is published in the Product Reliability Reports (
RR-1M
&
RR-B3A
).
B. Moisture Resistance Tests
Maxim evaluates pressure pot stress from every assembly process during qualification of each new design.
Pressure Pot testing must pass a 20% LTPD for acceptance. Additionally, industry standard 85
°
C/85%RH or HAST
tests are performed quarterly per device/package family.
C. E.S.D. and Latch-Up Testing
The HF76Z die type has been found to have all pins able to withstand a transient pulse of +/-1500V, per Mil-Std-
883 Method 3015 (reference attached ESD Test Circuit). Latch-Up testing has shown that this device withstands a
current of
±
250mA.
(Manager, Reliability Operations)
(Executive Director of QA)
Bryan Preeshl
Kenneth Huening (Vice President)
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