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  • 參數(shù)資料
    型號(hào): MAX3341EEVKIT
    廠商: Maxim Integrated Products, Inc.
    英文描述: Evaluation Kit for the MAX3341E
    中文描述: 評(píng)估板MAX3341E
    文件頁(yè)數(shù): 13/17頁(yè)
    文件大小: 389K
    代理商: MAX3341EEVKIT
    M
    ±15kV ESD-Protected USB Transceiver
    in UCSP
    ___________________________________________________________________________________________________
    13
    13
    IEC 1000-4-2
    The IEC 1000-4-2 standard covers ESD testing and
    performance of finished equipment; it does not specifi-
    cally refer to integrated circuits. The MAX3346E helps
    to design equipment that meets Level 2 of IEC 1000-4-
    2, without the need for additional ESD-protection com-
    ponents.
    The major difference between tests done using the
    Human Body Model and IEC 1000-4-2 is a higher peak
    current in IEC 1000-4-2, because series resistance is
    lower in the IEC 1000-4-2 model. Hence, the ESD with-
    stand voltage measured to IEC 1000-4-2 is generally
    lower than that measured using the Human Body Model.
    Figure 7a shows the IEC 1000-4-2 model.
    The Air-Gap Discharge test involves approaching the
    device with a charged probe. The Contact Discharge
    method connects the probe to the device before the
    probe is energized.
    Machine Model
    The Machine Model for ESD tests all pins using a 200pF
    storage capacitor and zero discharge resistance. Its
    objective is to emulate the stress caused by contact that
    occurs with handling and assembly during manufactur-
    ing. Of course, all pins require this protection during
    manufacturing, not just USB inputs and outputs.
    Therefore, after PC board assembly, the Machine Model
    is less relevant to I/O ports.
    UCSP Applications Information
    For the latest application details on UCSP construction,
    dimensions, tape carrier information, printed circuit board
    techniques, bump-pad layout, and recommended reflow
    temperature profile as well as the latest information on
    reliability testing results, go to the Maxim website at
    www.maxim-ic.com/ucsp for the Application Note,
    “UCSP—A Wafer-Level Chip-Scale Package.”
    CHARGE-CURRENT
    LIMIT RESISTOR
    DISCHARGE
    RESISTANCE
    STORAGE
    CAPACITOR
    Cs
    150pF
    R
    C
    50M
    to 100M
    R
    D
    330
    HIGH-
    VOLTAGE
    DC
    SOURCE
    DEVICE
    UNDER
    TEST
    Figure 7a. IEC 1000-4-2 ESD Test Model
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