參數(shù)資料
型號(hào): MA4P504-1072
元件分類(lèi): 參考電壓二極管
英文描述: SILICON, PIN DIODE
封裝: HERMETIC SEALED, CERAMIC, CASE 1072, 2 PIN
文件頁(yè)數(shù): 6/7頁(yè)
文件大?。?/td> 332K
代理商: MA4P504-1072
North America Tel: 800.366.2266 / Fax: 978.366.2266
Europe Tel: 44.1908.574.200 / Fax: 44.1908.574.300
Asia/Pacific Tel: 81.44.844.8296 / Fax: 81.44.844.8298
Visit www.macom.com for additional data sheets and product information.
M/A-COM Inc. and its affiliates reserve the right to make changes to the product(s) or
information contained herein without notice.
ADVANCED: Data Sheets contain information regarding a product M/A-COM is considering for
development. Performance is based on target specifications, simulated results, and/or prototype
measurements. Commitment to develop is not guaranteed.
PRELIMINARY: Data Sheets contain information regarding a product M/A-COM has under develop-
ment. Performance is based on engineering tests. Specifications are typical. Mechanical outline has
been fixed. Engineering samples and/or test data may be available. Commitment to produce in
volume is not guaranteed.
MA4P100 thru MA4P600 Series
Packaged PIN Diodes
M/A-COM Products
RoHS Compliant
Inspection
Method
Condition
Storage
Temperature
1031
See Maximum Ratings
Operating
Temperature
——
See Maximum Ratings
Temperature
Cycling
1051
5 cycles
- 65°C to +150°C
Shock
2016
500g’s
Vibration
2056
15g’s
Constant
Acceleration
2006
20,000g’s
Humidity
1021
10 Days
Environmental Ratings
Per MIL-STD 750
The following table is recommended for Group B and C
testing for TX, TXV level screening.
Inspection
Method
Condition
Internal Visual
and / or X-Ray
2072, 2076
See Note
High Temp.
Storage
1032
48 hours minimum @
max. storage temp.
Thermal Shock
1051
10 Cycles
Constant
Acceleration
2006
20,000 g's, Y1
Fine Leak
1071
H
Gross Leak
1071
C or E
Electrical
——
See Note
Burn-In
1038
See Note
Note:
Conditions and details of test depend on specific model number. Information available upon request. Case styles 1056 and 1088 are not
military, MIL-STD-750, rated packages.
Screened Diodes
Per MIL-STD 750
Suggested method and condition for TX and TXV level
screening.
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