translates into about 5.5 10–7 fEOSC
參數(shù)資料
型號: LTC2436-1IGN#TR
廠商: Linear Technology
文件頁數(shù): 17/28頁
文件大小: 0K
描述: IC CONV A/D 16B 2CH DIFF 16SSOP
標準包裝: 2,500
位數(shù): 16
采樣率(每秒): 6.8
數(shù)據(jù)接口: MICROWIRE?,串行,SPI?
轉換器數(shù)目: 1
功率耗散(最大): 1mW
電壓電源: 單電源
工作溫度: -40°C ~ 85°C
安裝類型: 表面貼裝
封裝/外殼: 16-SSOP(0.154",3.90mm 寬)
供應商設備封裝: 16-SSOP
包裝: 帶卷 (TR)
輸入數(shù)目和類型: 1 個差分,雙極
LTC2436-1
24
24361f
translates into about 5.5 10–7 fEOSCLSB additional INL
error. Figure 23 shows the typical INL error due to the
source resistance driving the REF+ or REFpins when
large CREF values are used. The effect of the source
resistance on the two reference pins is additive with
respect to this INL error. In general, matching of source
impedance for the REF+ and REFpins does not help the
gain or the INL error. The user is thus advised to minimize
the combined source impedance driving the REF+ and
REFpins rather than to try to match it.
The magnitude of the dynamic reference current depends
upon the size of the very stable internal sampling capaci-
tors and upon the accuracy of the converter sampling
clock. The accuracy of the internal clock over the entire
temperature and power supply range is typical better than
0.5%. Such a specification can also be easily achieved by
an external clock. When relatively stable resistors
(50ppm/
°C) are used for the external source impedance
seen by REF+ and REF, the expected drift of the dynamic
current gain error will be insignificant (about 1% of its
value over the entire temperature and voltage range). Even
for the most stringent applications a one-time calibration
operation may be sufficient.
In addition to the reference sampling charge, the reference
pins ESD protection diodes have a temperature dependent
leakage current. This leakage current, nominally 1nA
(
±10nA max), results in a small gain error. A 100 source
resistance will create a 0.05
V typical and 0.5V maxi-
mum full-scale error.
Output Data Rate
When using its internal oscillator, the LTC2436-1 can
produce up to 6.8 readings per second. The actual output
data rate will depend upon the length of the sleep and data
output phases which are controlled by the user and which
can be made insignificantly short. When operated with an
external conversion clock (FO connected to an external
oscillator), the LTC2436-1 output data rate can be in-
creased as desired. The duration of the conversion phase
is 20510/fEOSC. If fEOSC = 139,800Hz, the converter be-
haves as if the internal oscillator is used with simultaneous
50Hz/60Hz. There is no significant difference in the
LTC2436-1 performance between these two operation
modes.
An increase in fEOSC over the nominal 139,800Hz will
translate into a proportional increase in the maximum
output data rate. This substantial advantage is neverthe-
less accompanied by three potential effects, which must
be carefully considered.
First, a change in fEOSC will result in a proportional change
in the internal notch position and in a reduction of the
converter differential mode rejection at the power line
frequency. In many applications, the subsequent perfor-
mance degradation can be substantially reduced by rely-
ing upon the LTC2436-1’s exceptional common mode
rejection and by carefully eliminating common mode to
differential mode conversion sources in the input circuit.
The user should avoid single-ended input filters and
should maintain a very high degree of matching and
symmetry in the circuits driving the IN+ and INpins.
Second, the increase in clock frequency will increase
proportionally the amount of sampling charge transferred
through the input and the reference pins. If large external
APPLICATIO S I FOR ATIO
WU
UU
Figure 23. INL vs Differential Input Voltage (VIN = IN+ – IN)
and Reference Source Resistance (RSOURCE at REF
+ and REF
for Large CREF Values (CREF ≥ 1F)
VINDIF/VREFDIF
–0.5 –0.4–0.3–0.2–0.1 0
0.1 0.2 0.3 0.4 0.5
INL
(LSB)
1
0
–1
VCC = 5V
REF+ = 5V
REF– = GND
VINCM = 0.5 (IN
+ + IN) = 2.5V
FO = GND
CREF = 10F
TA = 25°C
RSOURCE = 1000
24361 F23
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