參數(shù)資料
型號: LMV793MF
廠商: NATIONAL SEMICONDUCTOR CORP
元件分類: 運動控制電子
英文描述: 88 MHz, Low Noise, 1.8V CMOS Input, Decompensated Operational Amplifiers
中文描述: OP-AMP, 1650 uV OFFSET-MAX, 88 MHz BAND WIDTH, PDSO5
封裝: SOT-23, 5 PIN
文件頁數(shù): 4/22頁
文件大?。?/td> 543K
代理商: LMV793MF
I
OUT
Output Short Circuit Current
Sourcing to V
V
IN
= 200 mV (Note 10)
Sinking to V
+
V
IN
= –200 mV (Note 10)
LMV793
45
37
60
mA
10
6
21
I
S
Supply Current per Amplifier
1.15
1.40
1.75
1.70
2.05
mA
LMV794 per Channel
1.30
SR
Slew Rate
A
V
= +10, Rising (10% to 90%)
A
V
= +10, Falling (90% to 10%)
A
V
= +10, R
L
= 10 k
f = 1 kHz
35
V/
μ
s
28
GBWP
Gain Bandwidth Product
88
MHz
e
n
i
n
THD+N
Input-Referred Voltage Noise
5.8
nV/
Input-Referred Current Noise
f = 1 kHz
0.01
pA/
Total Harmonic Distortion +
Noise
f = 1 kHz, A
V
= 1, R
L
= 600
0.01
%
Note 1:
Absolute Maximum Ratings indicate limits beyond which damage to the device may occur. Operating Ratings indicate conditions for which the device is
intended to be functional, but specific performance is not guaranteed. For guaranteed specifications and the test conditions, see the Electrical Characteristics
Tables.
Note 2:
Human Body Model, applicable std. MIL-STD-883, Method 3015.7. Machine Model, applicable std. JESD22-A115-A (ESD MM std. of JEDEC)
Field-Induced Charge-Device Model, applicable std. JESD22-C101-C (ESD FICDM std. of JEDEC).
Note 3:
The maximum power dissipation is a function of T
, θ
. The maximum allowable power dissipation at any ambient temperature is
P
D
= (T
J(MAX)
- T
A
)/θ
JA
. All numbers apply for packages soldered directly onto a PC Board.
Note 4:
Electrical Table values apply only for factory testing conditions at the temperature indicated. Factory testing conditions result in very limited self-heating
of the device such that T
J
= T
A
. No guarantee of parametric performance is indicated in the electrical tables under conditions of internal self-heating where T
J
>
T
A
.
Note 5:
Typical values represent the most likely parametric norm as determined at the time of characterization. Actual typical values may vary over time and will
also depend on the application and configuration. The typical values are not tested and are not guaranteed on shipped production material.
Note 6:
Limits are 100% production tested at 25°C. Limits over the operating temperature range are guaranteed through correlations using the statistical quality
control (SQC) method.
Note 7:
Offset voltage average drift is determined by dividing the change in V
OS
by temperature change.
Note 8:
Positive current corresponds to current flowing into the device.
Note 9:
Input bias current and input offset current are guaranteed by design
Note 10:
The short circuit test is a momentary test, the short circuit duration is 1.5 ms.
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