Absolute Maximum Ratings
(Note 10)
If Military/Aerospace specified devices are required,
please contact the National Semiconductor Sales
Office/Distributors for availability and specifications.
Supply Voltage
a
35V to
b
0.2V
a
6V to
b
1.0V
Output Voltage
Output Current
10 mA
Storage Temperature,
TO-46 Package
TO-92 Package
SO-8 Package
b
76
§
F to
a
356
§
F
b
76
§
F to
a
300
§
F
b
65
§
C to
a
150
§
C
ESD Susceptibility (Note 11)
800V
Lead Temp.
TO-46 Package (Soldering, 10 seconds)
TO-92 Package (Soldering, 10 seconds)
a
300
§
C
a
260
§
C
SO Package (Note 12):
Vapor Phase (60 seconds)
Infrared (15 seconds)
215
§
C
220
§
C
Specified Operating Temp. Range (Note 2)
T
MIN
to T
MAX
b
50
§
F to
a
300
§
F
b
40
§
F to
a
230
§
F
a
32
§
F to
a
212
§
F
LM34, LM34A
LM34C, LM34CA
LM34D
DC Electrical Characteristics
(Note 1,
Note 6
)
LM34A
LM34CA
Parameter
Conditions
Tested
Limit
(Note 4)
Design
Limit
(Note 5)
Tested
Limit
(Note 4)
Design
Limit
(Note 5)
Units
(Max)
Typical
Typical
Accuracy (Note 7)
T
A
e a
77
§
F
T
A
e
0
§
F
T
A
e
T
MAX
T
A
e
T
MIN
T
MIN
s
T
A
s
T
MAX
T
MIN
s
T
A
s
T
MAX
g
0.4
g
0.6
g
0.8
g
0.8
g
1.0
g
0.4
g
0.6
g
0.8
g
0.8
g
1.0
§
F
§
F
§
F
§
F
§
F
g
2.0
g
2.0
g
2.0
g
2.0
g
3.0
Nonlinearity (Note 8)
g
0.35
a
10.0
g
0.7
g
0.30
a
10.0
g
0.6
a
9.9,
a
10.1
Sensor Gain
(Average Slope)
a
9.9,
a
10.1
mV/
§
F, min
mV/
§
F, max
Load Regulation
(Note 3)
T
A
e a
77
§
F
T
MIN
s
T
A
s
T
MAX
0
s
I
L
s
1 mA
T
A
e a
77
§
F
5V
s
V
S
s
30V
V
S
e a
5V,
a
77
§
F
V
S
e a
5V
V
S
e a
30V,
a
77
§
F
V
S
e a
30V
4V
s
V
S
s
30V,
a
77
§
F
5V
s
V
S
s
30V
g
0.4
g
0.5
g
1.0
g
0.4
g
0.5
g
1.0
mV/mA
mV/mA
g
3.0
g
3.0
Line Regulation (Note 3)
g
0.01
g
0.02
g
0.05
g
0.01
g
0.02
g
0.05
mV/V
mV/V
g
0.1
g
0.1
Quiescent Current
(Note 9)
75
131
76
132
90
75
116
76
117
90
m
A
m
A
m
A
m
A
160
139
92
92
163
142
Change of Quiescent
Current (Note 3)
a
0.5
a
1.0
2.0
0.5
1.0
2.0
m
A
m
A
3.0
3.0
Temperature Coefficient
of Quiescent Current
a
0.30
a
0.5
a
0.30
a
0.5
m
A/
§
F
Minimum Temperature
for Rated Accuracy
In circuit ofFigure 1,
I
L
e
0
T
j
e
T
MAX
for 1000 hours
a
3.0
a
5.0
a
3.0
a
5.0
§
F
Long-Term Stability
g
0.16
g
0.16
§
F
Note 1:
Unless otherwise noted, these specifications apply:
b
50
§
F
s
T
j
s
a
300
§
F for the LM34 and LM34A;
b
40
§
F
s
T
j
s
a
230
§
F for the LM34C and
LM34CA; and
a
32
§
F
s
T
j
s
a
212
§
F for the LM34D. V
S
e a
5 Vdc and I
LOAD
e
50
m
A in the circuit ofFigure 2;
a
6 Vdc for LM34 and LM34A for 230
§
F
s
T
j
s
300
§
F. These specifications also apply from
a
5
§
F to T
MAX
in the circuit of Figure 1.
Note 2:
Thermal resistance of the TO-46 package is 720
§
F/W junction to ambient and 43
§
F/W junction to case. Thermal resistance of the TO-92 package is
324
F/W junction to ambient. Thermal resistance of the small outline molded package is 400
F/W junction to ambient. For additional thermal resistance informa-
tion see table in the Typical Applications section.
Note 3:
Regulation is measured at constant junction temperature using pulse testing with a low duty cycle. Changes in output due to heating effects can be
computed by multiplying the internal dissipation by the thermal resistance.
Note 4:
Tested limits are guaranteed and 100% tested in production.
Note 5:
Design limits are guaranteed (but not 100% production tested) over the indicated temperature and supply voltage ranges. These limits are not used to
calculate outgoing quality levels.
Note 6:
Specification in
BOLDFACE TYPE
apply over the full rated temperature range.
Note 7:
Accuracy is defined as the error between the output voltage and 10 mV/
§
F times the device’s case temperature at specified conditions of voltage, current,
and temperature (expressed in
§
F).
Note 8:
Nonlinearity is defined as the deviation of the output-voltage-versus-temperature curve from the best-fit straight line over the device’s rated temperature
range.
Note 9:
Quiescent current is defined in the circuit of Figure 1.
Note 10:
Absolute Maximum Ratings indicate limits beyond which damage to the device may occur. DC and AC electrical specifications do not apply when
operating the device beyond its rated operating conditions (see Note 1).
Note 11:
Human body model, 100 pF discharged through a 1.5 k
X
resistor.
Note 12:
See AN-450 ‘‘Surface Mounting Methods and Their Effect on Product Reliability’’ or the section titled ‘‘Surface Mount’’ found in a current National
Semiconductor Linear Data Book for other methods of soldering surface mount devices.
2