參數(shù)資料
型號(hào)： LA17000M
廠商： Sanyo Electric Co.,Ltd.
英文描述： Tuner System IC with Built-in PLL for Car Audio Applications
中文描述： 調(diào)諧器集成電路與系統(tǒng)專(zhuān)為汽車(chē)音響應(yīng)用的鎖相環(huán)
文件頁(yè)數(shù)： 22/54頁(yè)
文件大?。?/td> 830K
代理商： LA17000M
LA17000M
No. 6522-22/54
Continued from preceding page.
No.
Control block/Data
Unlock detection data
Description
Related data
This data selects the phase error (
E) detection width that is used for evaluating
PLL lock.
If a phase error that exceeds the
E detection width in the following table is
generated, the signal is deemed to be unlocked. When the signal is unlocked,
the detection pin (DO or I/O-5) goes low.
UL1, UL0
This is the crystal oscillator selection data.
* When a power-on reset is executed, 10.25 MHz is selected.
Crystal oscillator buffer (XBUF) output control data.
XB = 0: Buffer output: OFF (This mode is selected when a power-on reset is
executed.)
XB = 1: Buffer output ON
* For FM reception (using the PD0 pin), XBUF output must be off.
This data controls the phase comparator dead zone.
When a power-on reset is executed, DZA is selected.
This data is used to force the charge pump output to the low level (V
SS
level).
DLC = 1: Low level
= 0: Normal operation
* If a deadlock occurs because the VCO control voltage (Vtune) is 0 V and VCO
oscillation is stopped, it is possible to escape the deadlock by forcing the
charge pump output to low level and setting Vtune to V
CC
.
When a power-on reset is executed, normal operation mode is selected.
This is the IC test data.
Set TEST0 = 0.
TEST1 = 0
TEST2 = 0
* When a power-on reset is executed, all the test data is set to zero.
(12)
ULD
DT0, DT1
R0 to R3
(13)
UL1
DT0
E detection width
Detection pin output
0
0
1
1
0
1
0
1
Stop
0
±0.5
μ
s
±1
μ
s
Open
Direct output of
E
Extend
E by 1 to 2 ms
Extend
E by 1 to 2 ms
Unlocked output
XS1
XS0
X
’
tal OSC
0
0
1
1
0
1
0
1
Prohibited
Prohibited
10.25 MHz
10.35 MHz
DZ1
DZ0
Dead zone mode
0
0
1
1
0
1
0
1
DZA
DZB
DZC
DZD
(14)
(15)
(16)
Extention
Crystal oscillator circuit
XS0, XS1
XB
Phase comparator control
data
DZ0, DZ1
Charge pump control data
DLC
IC test data
TEST0
TEST1
TEST2
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