參數(shù)資料
型號: KAI-16000-AAA-JD-AE
廠商: KODAK IMAGE SENSOR SOLUTIONS
元件分類: CCD Image Sensor
英文描述: IMAGE SENSOR-CCD, 4872(H) X 3248(V) PIXEL, RECTANGULAR, THROUGH HOLE MOUNT
封裝: PGA-40
文件頁數(shù): 7/32頁
文件大小: 1326K
代理商: KAI-16000-AAA-JD-AE
TESTS
1.
Global Non-Uniformity
This test is performed with the imager illuminated to a level such that the output is at 70% of saturation (approximately
630 mV). Prior to this test being performed the substrate voltage has been set such that the charge capacity of the
sensor is 900 mV. Global non-uniformity is defined as
Signal
Area
Active
=
Deviation
Standard
Area
Active
*
100
Uniformity
-
Non
Global
Units: %rms
Active Area Signal = Active Area Average – Horizontal Overclock Average
2. Dark field defect test
This test is performed under dark field conditions. The sensor is partitioned into 384 sub regions of interest, each of
which is 203 by 203 pixels in size. In each region of interest, the median value of all pixels is found. For each region of
interest, a pixel is marked defective if it is greater than or equal to the median value of that region of interest plus the
defect threshold specified in the “Defect Definitions” section.
3. Bright field defect test
This test is performed with the imager illuminated to a level such that the output is at approximately 630mV. Prior to
this test being performed the substrate voltage has been set such that the charge capacity of the sensor is 900mV. The
average signal level of all active pixels is found. The bright and dark thresholds are set as:
Dark defect threshold
= Active Area Signal * threshold
Bright defect threshold = Active Area Signal * threshold
The sensor is then partitioned into 384 sub regions of interest, each of which is 203 by 203 pixels in size. In each region
of interest, the average value of all pixels is found. For each region of interest, a pixel is marked defective if it is
greater than or equal to the median value of that region of interest plus the bright threshold specified or if it is less
than or equal to the median value of that region of interest minus the dark threshold specified.
Example for major bright field defective pixels:
Average value of all active pixels is found to be 630 mV
Dark defect threshold: 630mV * 15% = 95 mV
Bright defect threshold: 630mV * 15% = 95 mV
Region of interest #1 selected. This region of interest is pixels 1,1 to pixels 203, 203.
o
Median of this region of interest is found to be 630 mV.
o
Any pixel in this region of interest that is >= (630+95 mV) 535 mV in intensity will be marked defective.
o
Any pixel in this region of interest that is <= (630-95 mV) 725 mV in intensity will be marked defective.
All remaining 384 sub regions of interest are analyzed for defective pixels in the same manner.
Eastman Kodak Company, 2007
www.kodak.com/go/imagers
Revision 2.0 MTD/PS-1027 p15
相關(guān)PDF資料
PDF描述
KAI-2001-AAA-CF-BA IMAGE SENSOR-CCD, 1600(H) X 1200(V) PIXEL, RECTANGULAR, THROUGH HOLE MOUNT
KAS1104E SLIDE DIP SWITCH-4SWITCHES, SPST, LATCHED,THROUGH HOLE-STRAIGHT
KBL06 4 A, 600 V, SILICON, BRIDGE RECTIFIER DIODE
KBP04G 1.5 A, 400 V, SILICON, BRIDGE RECTIFIER DIODE
KBPC2508IP 25 A, 800 V, SILICON, BRIDGE RECTIFIER DIODE
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