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參數(shù)資料
| 型號： | JANTXV2N4234 |
| 英文描述： | TRANSISTOR | BJT | PNP | 40V V(BR)CEO | 1A I(C) | TO-5 |
| 中文描述： | 晶體管|晶體管|進步黨| 40V的五（巴西）總裁| 1A條一（c）|至5 |
| 文件頁數(shù)： | 2/19頁 |
| 文件大小： | 103K |
| 代理商： | JANTXV2N4234 |
MIL-PRF-19500/512E
10
4.3.2 Thermal impedance (ZθJX measurements). The ZθJX measurements shall be performed in accordance with
method 3131 of MIL-STD-750.
a.
IM measurement current ...................... 5 mA.
b.
IH forward heating current ................... 200 mA (min).
c.
tH heating time..................................... 25 - 30 ms.
d.
tmd measurement delay time .............. 60 s max.
e.
VCE collector-emitter voltage .............. 10 V dc minimum( same as VH ).
f.
VH collector-emitter heating voltage ... 10 V ( minimum ).
g.
tSW sample window time .................... 10 s ( maximum ).
The maximum limit for ZθJX under these test conditions are ZθJX (max) = 60°C/W. (UA and UB); 67°C/W (2N4029
and 2N4033).
4.3.3 Screening (JANHC and JANKC). Screening of JANHC and JANKC die shall be in accordance with
MIL-PRF-19500, "Discrete Semiconductor Die/Chip Lot Acceptance". Burn-in duration for the JANKC level follows
JANS requirements; the JANHC follows JANTX requirements.
4.4 Conformance inspection. Conformance inspection shall be in accordance with MIL-PRF-19500 and as
specified herein.
4.4.1
Group A inspection. Group A inspection shall be conducted in accordance with appendix E, table V of
MIL-PRF-19500 and table I herein.
4.4.2 Group B inspection. Group B inspection shall be conducted in accordance with the tests and conditions
specified for subgroup testing in table VIa (JANS) of MIL-PRF-19500 and 4.4.2.1 herein. Electrical measurements
(end-points) and delta requirements shall be in accordance with group A, subgroup 2 and 4.5.2 herein: delta
requirements only apply to subgroups B4, and B5. See 4.4.2.2 for JAN, JANTX, and JANTXV group B testing.
Electrical measurements (end-points) and delta requirements for JAN, JANTX, and JANTXV shall be after each step
in 4.4.2.2 and shall be in accordance with group A, subgroup 2 and 4.5.2 herein.
4.4.2.1 Group B inspection, table VIa (JANS) of MIL-PRF-19500.
Subgroup
Method
Condition
B4
1037
VCB = 10 V dc.
B5
1027
VCB = 10 – 20 V dc; PD ≥ 75 percent of maximum rated PT (see 1.3). Option 1:
96 hours min, sample size in accordance with table VIa of MIL-PRF-19500,
adjust TA to achieve TJ = +275°C minimum. Option 2: 216 hours., sample size
= 45, c = 0; adjust TA to achieve TJ = +225°C minimum.
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相關代理商/技術參數(shù) |
參數(shù)描述 |
|---|---|
| JANTXV2N4235 | 制造商:Microsemi Corporation 功能描述:Trans GP BJT NPN 60V 1A 3-Pin TO-39 制造商:Microsemi Corporation 功能描述:TRANS GP BJT NPN 60V 1A 3PIN TO-39 - Bulk |
| JANTXV2N4236 | 制造商:Microsemi Corporation 功能描述:Trans GP BJT NPN 80V 1A 3-Pin TO-39 制造商:Microsemi Corporation 功能描述:TRANS GP BJT NPN 80V 1A 3PIN TO-39 - Bulk |
| JANTXV2N4237 | 制造商:Microsemi Corporation 功能描述:Trans GP BJT NPN 40V 1A 3-Pin TO-39 制造商:Microsemi Corporation 功能描述:TRANS GP BJT NPN 40V 1A 3PIN TO-39 - Bulk |
| JANTXV2N4238 | 制造商:Microsemi Corporation 功能描述:Trans GP BJT NPN 60V 1A 3-Pin TO-39 制造商:Microsemi Corporation 功能描述:TRANS GP BJT NPN 60V 1A 3PIN TO-39 - Bulk |
| JANTXV2N4239 | 制造商:Microsemi Corporation 功能描述:Trans GP BJT NPN 80V 1A 3-Pin TO-39 制造商:Microsemi Corporation 功能描述:TRANS GP BJT NPN 80V 1A 3PIN TO-39 - Bulk |
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