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參數(shù)資料
| 型號： | JANHCA2N3867 |
| 英文描述： | TRANSISTOR | BJT | PNP | 40V V(BR)CEO | 3A I(C) | TO-5 |
| 中文描述： | 晶體管|晶體管|進步黨| 40V的五（巴西）總裁| 3A條一（c）|至5 |
| 文件頁數(shù)： | 6/21頁 |
| 文件大?。?/td> | 307K |
| 代理商： | JANHCA2N3867 |
MIL-PRF-19500/350G
14
TABLE I. Group A inspection - Continued.
Inspection 1/
MIL-STD-750
Symbol
Limit
Unit
Method
Conditions
Min
Max
Subgroup 5 - Continued
Pulse response
3251
Test condition A
Rise time
VCC = -30 V dc, VEB = 0 V dc,
IC = 1.5 A dc, IB1 = 150 mA dc,
See figure 4
tr
65
ns
Storage time
VCC = -30 V dc, VEB = 0 V dc,
IC = 1.5 A dc,
IB1 = IB2 = 150 mA dc,
See figure 5
ts
500
ns
Fall time
VCC = -30 V dc, VEB = 0 V dc,
IC = 1.5 A dc,
IB1 = IB2 = 150 mA dc,
See figure 5
tf
100
ns
Subgroup 6
SOA (continuous dc)
3051
TC = +25°C, 1 cycle,
t = 1.0 s, (see figure 6)
Test 1
VCE = 3.33 V dc, IC = 3 A dc
Test 2
2N3867, 2N3867S
VCE = 40 V dc, IC = 160 mA dc
2N3868, 2N3868S
VCE = 60 V dc, IC = 80 mA dc
Electrical measurements
See table III, steps 1, and 2.
1/ For sampling plan see MIL-PRF-19500.
2/ For resubmission of failed subgroup A1, double the sample size of the failed test or sequence of tests. A failure
in group A, subgroup 1 shall not require retest of the entire subgroup. Only the failed test shall be rerun upon
submission.
3/ Separate samples may be used.
4/ Not required for JANS devices.
5/ Not required for laser marked devices.
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