參數(shù)資料
型號： IS82C54-12
廠商： HARRIS SEMICONDUCTOR
元件分類： XO, clock
英文描述： CMOS Programmable Interval Timer
中文描述： 3 TIMER(S), PROGRAMMABLE TIMER, PQCC28
文件頁數(shù)： 14/17頁
文件大小： 142K
代理商： IS82C54-12
4-14
AC Electrical Specifications
V
CC
= +5.0V
±
10%, T
A
= 0
o
C to +70
o
C (C82C54, C82C54-10, C82C54-12)
T
A
= -40
o
C to +85
o
C (I82C54, I82C54-10, I82C54-12)
T
A
= -55
o
C to +125
o
C (M82C54, M82C54-10, M82C54-12)
SYMBOL
PARAMETER
82C54
82C54-10
82C54-12
UNITS
TEST
CONDITIONS
MIN
MAX
MIN
MAX
MIN
MAX
READ CYCLE
(1)
TAR
Address Stable Before RD
30
-
25
-
25
-
ns
1
(2)
TSR
CS Stable Before RD
0
-
0
-
0
-
ns
1
(3)
TRA
Address Hold Time After RD
0
-
0
-
0
-
ns
1
(4)
TRR
RD Pulse Width
150
-
95
-
95
-
ns
1
(5)
TRD
Data Delay from RD
-
120
-
85
-
85
ns
1
(6)
TAD
Data Delay from Address
-
210
-
185
-
185
ns
1
(7)
TDF
RD to Data Floating
5
85
5
65
5
65
ns
2, Note 1
(8)
TRV
Command Recovery Time
200
-
165
-
165
-
ns
WRITE CYCLE
(9)
TAW
Address Stable Before WR
0
-
0
-
0
-
ns
(10)
TSW
CS Stable Before WR
0
-
0
-
0
-
ns
(11)
TWA
Address Hold Time After WR
0
-
0
-
0
-
ns
(12)
TWW
WR Pulse Width
95
-
95
-
95
-
ns
(13)
TDW
Data Setup Time Before WR
140
-
95
-
95
-
ns
(14)
TWD
Data Hold Time After WR
25
-
0
-
0
-
ns
(15)
TRV
Command Recovery Time
200
-
165
-
165
-
ns
CLOCK AND GATE
(16)
TCLK
Clock Period
125
DC
100
DC
80
DC
ns
1
(17)
TPWH
High Pulse Width
60
-
30
-
30
-
ns
1
(18)
TPWL
Low Pulse Width
60
-
40
-
30
-
ns
1
(19)
TR
Clock Rise Time
-
25
-
25
-
25
ns
(20)
TF
Clock Fall Time
-
25
-
25
-
25
ns
(21)
TGW
Gate Width High
50
-
50
-
50
-
ns
1
(22)
TGL
Gate Width Low
50
-
50
-
50
-
ns
1
(23)
TGS
Gate Setup Time to CLK
50
-
40
-
40
-
ns
1
(24)
TGH
Gate Hold Time After CLK
50
-
50
-
50
-
ns
1
(25)
TOD
Output Delay from CLK
-
150
-
100
-
100
ns
1
(26)
TODG
Output Delay from Gate
-
120
-
100
-
100
ns
1
(27)
TWO
OUT Delay from Mode Write
-
260
-
240
-
240
ns
1
(28)
TWC
CLK Delay for Loading
0
55
0
55
0
55
ns
1
(29)
TWG
Gate Delay for Sampling
-5
40
-5
40
-5
40
ns
1
(30)
TCL
CLK Setup for Count Latch
-40
40
-40
40
-40
40
ns
1
NOTE:
1. Not tested, but characterized at initial design and at major process/design changes.
82C54
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