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參數資料
| 型號： | IS42S81600A-7T |
| 英文描述： | 16Meg x 8, 8Meg x16 & 4Meg x 32 128-MBIT SYNCHRONOUS DRAM |
| 中文描述： | 16Meg × 8，8Meg x16 |
| 文件頁數： | 40/65頁 |
| 文件大?。?/td> | 556K |
| 代理商： | IS42S81600A-7T |
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46
XMEGA C3 [DATASHEET]
8361D–AVR–07/2013
28.
ADC – 12-bit Analog to Digital Converter
28.1 Features
One Analog to Digital Converter (ADC)
12-bit resolution
Up to 300 thousand samples per second
– Down to 2.3μs conversion time with 8-bit resolution
– Down to 3.35μs conversion time with 12-bit resolution
Differential and single-ended input
– 16 single-ended inputs
– 16x4 differential inputs without gain
– 8x4 differential input with gain
Built-in differential gain stage
– 1/2x, 1x, 2x, 4x, 8x, 16x, 32x, and 64x gain options
Single, continuous and scan conversion options
Three internal inputs
– Internal temperature sensor
–V
CC voltage divided by 10
– 1.1V bandgap voltage
Internal and external reference options
Compare function for accurate monitoring of user defined thresholds
Optional event triggered conversion for accurate timing
Optional DMA transfer of conversion results
Optional interrupt/event on compare result
28.2 Overview
The ADC converts analog signals to digital values. The ADC has 12-bit resolution and is capable of converting up to 300
thousand samples per second (ksps). The input selection is flexible, and both single-ended and differential
measurements can be done. For differential measurements, an optional gain stage is available to increase the dynamic
range. In addition, several internal signal inputs are available. The ADC can provide both signed and unsigned results.
The ADC measurements can either be started by application software or an incoming event from another peripheral in
the device. The ADC measurements can be started with predictable timing, and without software intervention. It is
possible to use DMA to move ADC results directly to memory or peripherals when conversions are done.
Both internal and external reference voltages can be used. An integrated temperature sensor is available for use with the
ADC. The VCC/10 and the bandgap voltage can also be measured by the ADC.
The ADC has a compare function for accurate monitoring of user defined thresholds with minimum software intervention
required.
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|---|---|
| IS42S81600A-7TI | 16Meg x 8, 8Meg x16 & 4Meg x 32 128-MBIT SYNCHRONOUS DRAM |
| IS61LF51218D-8.5TQ | 512K X 18 CACHE SRAM, 8.5 ns, PQFP100 |
| IS61LPD25636A-200B2 | 256K x 36, 512K x 18 9 Mb SYNCHRONOUS PIPELINED, DOUBLE CYCLE DESELECT STATIC RAM |
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相關代理商/技術參數 |
參數描述 |
|---|---|
| IS42S81600A-7TI | 制造商:ISSI 制造商全稱:Integrated Silicon Solution, Inc 功能描述:16Meg x 8, 8Meg x16 & 4Meg x 32 128-MBIT SYNCHRONOUS DRAM |
| IS42S81600A-7TL | 制造商:ISSI 制造商全稱:Integrated Silicon Solution, Inc 功能描述:16Meg x 8, 8Meg x16 & 4Meg x 32 128-MBIT SYNCHRONOUS DRAM |
| IS42S81600A-7TLI | 制造商:ISSI 制造商全稱:Integrated Silicon Solution, Inc 功能描述:16Meg x 8, 8Meg x16 & 4Meg x 32 128-MBIT SYNCHRONOUS DRAM |
| IS42S81600AL-7TL | 制造商:Integrated Silicon Solution Inc 功能描述: |
| IS42S81600B-6T | 制造商:ISSI 制造商全稱:Integrated Silicon Solution, Inc 功能描述:16Meg x 8, 8Meg x16 128-MBIT SYNCHRONOUS DRAM |
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