IDT72V263/273/283/293/103/113 3.3V HIGH DENSITY SUPERSYNC IITM NARROW BUS FIFO
參數(shù)資料
型號(hào)： IDT72V2103L15PFG
廠商： IDT, Integrated Device Technology Inc
文件頁數(shù)： 38/46頁
文件大小： 0K
描述： IC FIFO SUPERSYNCII 15NS 80-TQFP
標(biāo)準(zhǔn)包裝： 45
系列： 72V
功能： 異步，同步
存儲(chǔ)容量： 2.3K（131 x 18）
數(shù)據(jù)速率： 67MHz
訪問時(shí)間： 15ns
電源電壓： 3.15 V ~ 3.45 V
工作溫度： 0°C ~ 70°C
安裝類型： 表面貼裝
封裝/外殼： 80-LQFP
供應(yīng)商設(shè)備封裝： 80-TQFP（14x14）
包裝： 托盤
其它名稱： 72V2103L15PFG
43
IDT72V263/273/283/293/103/113 3.3V HIGH DENSITY SUPERSYNC IITM NARROW BUS FIFO
8K x 18, 16K x 9/18, 32K x 9/18, 64K x 9/18, 128K x 9/18, 256K x 9/18, 512K x9
COMMERCIAL AND INDUSTRIAL
TEMPERATURE RANGES
IDT72V2103/72V2113 3.3V HIGH DENSITY SUPERSYNC IITM NARROW BUS FIFO
131,072 x 18/262,144 x 9, 262,144 x 18/524,288 x 9
JUNE 1, 2010
Figure 33. TAP Controller State Diagram
Test-Logic
Reset
Run-Test/
Idle
1
0
Select-
DR-Scan
Select-
IR-Scan
1
Capture-IR
0
Capture-DR
0
Exit1-DR
1
Pause-DR
0
Exit2-DR
1
Update-DR
1
Exit1-IR
1
Exit2-IR
1
Update-IR
1
0
1
6119 drw36
0
Shift-DR
0
Shift-IR
0
Pause-IR
0
1
Input = TMS
0
1
Refer to the IEEE Standard Test Access Port Specification (IEEE Std.
1149.1) for the full state diagram.
All state transitions within the TAP controller occur at the rising edge of the
TCLK pulse. The TMS signal level (0 or 1) determines the state progression
that occurs on each TCLK rising edge. The TAP controller takes precedence
over the Queue and must be reset after power up of the device. See
TRST
description for more details on TAP controller reset.
Test-Logic-Reset All test logic is disabled in this controller state enabling
the normal operation of the IC. The TAP controller state machine is designed
in such a way that, no matter what the initial state of the controller is, the Test-
Logic-Reset state can be entered by holding TMS at high and pulsing TCK five
times. This is the reason why the Test Reset (
TRST) pin is optional.
Run-Test-Idle In this controller state, the test logic in the IC is active only if
certaininstructionsarepresent.Forexample,ifaninstructionactivatestheself
test, then it will be executed when the controller enters this state. The test logic
in the IC is idles otherwise.
Select-DR-Scan This is a controller state where the decision to enter the
Data Path or the Select-IR-Scan state is made.
Select-IR-Scan This is a controller state where the decision to enter the
InstructionPathismade.TheControllercanreturntotheTest-Logic-Resetstate
other wise.
Capture-IR In this controller state, the shift register bank in the Instruction
Register parallel loads a pattern of fixed values on the rising edge of TCK. The
last two significant bits are always required to be “01”.
Shift-IR In this controller state, the instruction register gets connected
betweenTDIandTDO,andthecapturedpatterngetsshiftedoneachrisingedge
ofTCK.TheinstructionavailableontheTDIpinisalsoshiftedintotheinstruction
register.
Exit1-IR ThisisacontrollerstatewhereadecisiontoentereitherthePause-
IR state or Update-IR state is made.
Pause-IR This state is provided in order to allow the shifting of instruction
register to be temporarily halted.
Exit2-DR This is a controller state where a decision to enter either the Shift-
IR state or Update-IR state is made.
Update-IR In this controller state, the instruction in the instruction register is
latched in to the latch bank of the Instruction Register on every falling edge of
TCK. This instruction also becomes the current instruction once it is latched.
Capture-DR In this controller state, the data is parallel loaded in to the data
registers selected by the current instruction on the rising edge of TCK.
Shift-DR, Exit1-DR, Pause-DR, Exit2-DR and Update-DR These
controller states are similar to the Shift-IR, Exit1-IR, Pause-IR, Exit2-IR and
Update-IR states in the Instruction path.
NOTE:
1. Five consecutive TCK cycles with TMS = 1 will reset the TAP.
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