277
Supply Voltage . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . +8.0V
Input, Output or I/O Voltage . . . . . . . . . . . . GND-0.5V to VCC +0.5V
ESD Classification . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . Class 1
Operating Conditions
Operating Voltage Range . . . . . . . . . . . . . . . . . . . . . +4.5V to +5.5V
Operating Temperature Range
C82C82. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .0oC to +70oC
I82C82 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . -40oC to +85oC
M82C82 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . -55oC to +125oC
Thermal Resistance (Typical)
θJA
θJC
CERDIP . . . . . . . . . . . . . . . . . . . . . . . .
75oC/W
18oC/W
CLCC. . . . . . . . . . . . . . . . . . . . . . . . . .
85oC/W
22oC/W
PDIP . . . . . . . . . . . . . . . . . . . . . . . . . .
75
N/A
PLCC . . . . . . . . . . . . . . . . . . . . . . . . . .
75
N/A
Storage Temperature Range . . . . . . . . . . . . . . . . .-65oC to +150oC
Maximum Junction Temperature
Ceramic Package . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . +175oC
Plastic Package . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . +150oC
Minimum Lead Temperature (Soldering 10s) . . . . . . . . . . . . +300oC
(PLCC Lead Tips Only)
Die Characteristics
Gate Count . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 65 Gates
CAUTION: Stresses above those listed in “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress only rating and operation
of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied.
DC Electrical Specifications VCC = 5.0V ±10%;
TA = 0
oC to +70oC (C82C82);
TA = -40
oC to +85oC (I82C82);
TA = -55
oC to +125oC (M82C82)
SYMBOL
PARAMETER
MIN
MAX
UNITS
TEST CONDITIONS
VIH
Logical One Input Voltage
2.0
-
V
C82C82, I82C82 (Note 1)
2.2
-
V
M82C82 (Note 1)
VIL
Logical Zero Input Voltage
-
0.8
V
VOH
Logical One Output Voltage
2.9
-
V
IOH = -8mA, OE = GND
VCC -0.4V
-
V
IOH = -100A, OE = GND
VOL
Logical Zero Output Voltage
-
0.4
V
IOL = 8mA, OE = GND
II
Input Leakage Current
-1.0
1.0
AVIN = GND or VCC, DIP Pins 1-9, 11
IO
Output Leakage Current
-10.0
10.0
AVO = GND or VCC, OE ≥ VCC -0.5V
DIP Pins 12-19
ICCSB
Standby Power Supply Cur-
rent
-10
AVIN = VCC or GND, VCC = 5.5V, Outputs Open
ICCOP
Operating Power Supply
Current
-1
mA/MHz
TA = +25
oC, V
CC = 5V, Typical (See Note 2)
NOTES:
1. VIH is measured by applying a pulse of magnitude = VIH min to one data input at a time and checking the corresponding device output
for a valid logical “1” during valid input high time. Control pins (STB, OE) are tested separately with all device data input pins at VCC -0.4.
2. Typical ICCOP = 1mA/MHz of STB cycle time. (Example: 5MHz
P, ALE = 1.25MHz, ICCOP = 1.25mA).
Capacitance
TA = +25
oC
SYMBOL
PARAMETER
TYPICAL
UNITS
TEST CONDITIONS
CIN
Input Capacitance
13
pF
Freq = 1MHz, all measurements are
referenced to device GND
COUT
Output Capacitance
20
pF
82C82