參數(shù)資料
型號(hào)： ICL3245E
廠商： Intersil Corporation
英文描述： ±15kV ESD Protected, +3V to +5.5V, 1Microamp, 1Mbps, RS-232 Transceivers with Enhanced Automatic Powerdown(±15kV ESD 防護(hù), +3V至+5.5V, 1微安, 1Mbps, RS-232收發(fā)器，具有增強(qiáng)型自動(dòng)關(guān)斷功能)
中文描述： ± 15kV的ESD保護(hù)，3V至5.5V，1Microamp，1Mbps的，RS - 232接口的增強(qiáng)型自動(dòng)掉電（± 15kV的ESD防護(hù)，采用3V至5.5V的，1微安，1Mbps的，RS - 232接口收發(fā)器，具有增強(qiáng)型自動(dòng)關(guān)收發(fā)器斷功能）
文件頁(yè)數(shù)： 14/20頁(yè)
文件大?。?/td> 444K
代理商： ICL3245E
14
FN4900.9
February 27, 2006
Human Body Model (HBM) Testing
As the name implies, this test method emulates the ESD
event delivered to an IC during human handling. The tester
delivers the charge through a 1.5k
current limiting resistor,
making the test less severe than the IEC61000 test which
utilizes a 330
limiting resistor. The HBM method
determines an ICs ability to withstand the ESD transients
typically present during handling and manufacturing. Due to
the random nature of these events, each pin is tested with
respect to all other pins. The RS-232 pins on “E” family
devices can withstand HBM ESD events to
±
15kV.
IEC61000-4-2 Testing
The IEC61000 test method applies to finished equipment,
rather than to an individual IC. Therefore, the pins most likely
to suffer an ESD event are those that are exposed to the
outside world (the RS-232 pins in this case), and the IC is
tested in its typical application configuration (power applied)
rather than testing each pin-to-pin combination. The lower
current limiting resistor coupled with the larger charge
storage capacitor yields a test that is much more severe than
the HBM test. The extra ESD protection built into this
device’s RS-232 pins allows the design of equipment
meeting level 4 criteria without the need for additional board
level protection on the RS-232 port.
AIR-GAP DISCHARGE TEST METHOD
For this test method, a charged probe tip moves toward the
IC pin until the voltage arcs to it. The current waveform
delivered to the IC pin depends on approach speed,
humidity, temperature, etc., so it is difficult to obtain
repeatable results. The “E” device RS-232 pins withstand
±
15kV air-gap discharges.
CONTACT DISCHARGE TEST METHOD
During the contact discharge test, the probe contacts the
tested pin before the probe tip is energized, thereby
eliminating the variables associated with the air-gap
discharge. The result is a more repeatable and predictable
test, but equipment limits prevent testing devices at voltages
higher than
±
8kV. All “E” family devices survive
±
8kV contact
discharges on the RS-232 pins.
Typical Performance Curves
V
CC
= 3.3V, T
A
= 25°C
FIGURE 15. TRANSMITTER OUTPUT VOLTAGE vs LOAD
CAPACITANCE
FIGURE 16. SLEW RATE vs LOAD CAPACITANCE
-6
-4
-2
0
2
4
6
1000
2000
3000
4000
5000
0
LOAD CAPACITANCE (pF)
T
1 TRANSMITTER AT 1Mbps
OTHER TRANSMITTERS AT 30kbps
V
OUT
+
V
OUT
-
LOAD CAPACITANCE (pF)
S
μ
s
0
1000
2000
3000
4000
5000
0
10
30
50
110
-SLEW
+SLEW
70
90
ICL3225E, ICL3227E, ICL3245E
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