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    參數(shù)資料
    型號: HX6356KSFC
    廠商: Electronic Theatre Controls, Inc.
    英文描述: 32K x 8 STATIC RAM-SOI
    中文描述: 32K的× 8靜態(tài)RAM的絕緣硅
    文件頁數(shù): 1/12頁
    文件大小: 145K
    代理商: HX6356KSFC
    32K x 8 STATIC RAM—SOI
    HX6356
    Aerospace Electronics
    FEATURES
    RADIATION
    Fabricated with RICMOS
    IV Silicon on Insulator (SOI)
    0.75
    μ
    m Process (L
    eff
    = 0.6
    μ
    m)
    Total Dose Hardness through 1x10
    6
    rad(SiO
    2
    )
    Neutron Hardness through 1x10
    14
    cm
    -2
    Dynamic and Static Transient Upset Hardness
    through 1x10
    11
    rad(Si)/s
    Dose Rate Survivability through 1x10
    12
    rad(Si)/s
    Soft Error Rate of <1x10
    -10
    upsets/bit-day
    in Geosynchronous Orbit
    Latchup Free
    GENERAL DESCRIPTION
    The 32K x 8 Radiation Hardened Static RAM is a high
    performance 32,768 word x 8-bit static random access
    memory with industry-standard functionality. It is fabricated
    with Honeywell’s radiation hardened technology, and is
    designed for use in systems operating in harsh, transient
    radiation environments. The RAM operates over the full
    military temperature range and requires only a single 5 V
    ±
    10% power supply. The RAM is available with either TTL or
    CMOS compatible I/O. Power consumption is typically less
    than 15 mW/MHz in operation, and less than 5 mW when
    de-selected. The RAM read operation is fully asynchro-
    nous, with an associated typical access time of 14 ns at 5V.
    Honeywell’s enhanced SOI RICMOS
    IV (Radiation Insen-
    sitive CMOS) technology is radiation hardened through the
    use of advanced and proprietary design, layout and pro-
    cess hardening techniques. The RICMOS
    IV process is a
    5-volt, SIMOX CMOS technology with a 150 gate oxide
    and a minimum drawn feature size of 0.75
    μ
    m (0.6
    μ
    m
    effective gate length—L
    ). Additional features include
    tungsten via plugs, Honeywell’s proprietary SHARP pla-
    narization process, and a lightly doped drain (LDD) struc-
    ture for improved short channel reliability. A 7 transistor
    (7T) memory cell is used for superior single event upset
    hardening, while three layer metal power bussing and the
    low collection volume SIMOX substrate provide improved
    dose rate hardening.
    OTHER
    Listed On SMD# 5962-95845
    Fast Read/Write Cycle Times
    17 ns (Typical)
    25 ns (-55 to 125
    °
    C)
    Typical Operating power < 15 mW/MHz
    Asynchronous Operation
    CMOS or TTL Compatible I/O
    Single 5 V
    ±
    10% Power Supply
    Packaging Options
    - 36-Lead CFP—Bottom Braze (0.630 in. x 0.650 in.)
    - 36-Lead CFP—Top Braze (0.630 in. x 0.650 in.)
    相關(guān)PDF資料
    PDF描述
    HX6356KSFT 32K x 8 STATIC RAM-SOI
    HX6356KSHC 32K x 8 STATIC RAM-SOI
    HX6356KSHT 32K x 8 STATIC RAM-SOI
    HX6356KSNC 32K x 8 STATIC RAM-SOI
    HX6356KSNT 32K x 8 STATIC RAM-SOI
    相關(guān)代理商/技術(shù)參數(shù)
    參數(shù)描述
    HX6356KSFT 制造商:未知廠家 制造商全稱:未知廠家 功能描述:32K x 8 STATIC RAM-SOI
    HX6356KSHC 制造商:未知廠家 制造商全稱:未知廠家 功能描述:32K x 8 STATIC RAM-SOI
    HX6356KSHT 制造商:未知廠家 制造商全稱:未知廠家 功能描述:32K x 8 STATIC RAM-SOI
    HX6356KSNC 制造商:未知廠家 制造商全稱:未知廠家 功能描述:32K x 8 STATIC RAM-SOI
    HX6356KSNT 制造商:未知廠家 制造商全稱:未知廠家 功能描述:32K x 8 STATIC RAM-SOI