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參數(shù)資料
| 型號(hào)： | HI5810 |
| 廠商： | Intersil Corporation |
| 英文描述： | CMOS 10 Microsecond, 12-Bit, Sampling A/D Converter with Internal Track and Hold(CMOS 12位片內(nèi)帶跟蹤和保持電路的ADC) |
| 中文描述： | 10微秒的CMOS，12位，采樣的A / D轉(zhuǎn)換器內(nèi)部跟蹤和保持的CMOS（12位片內(nèi)帶跟蹤和保持電路的ADC）的 |
| 文件頁(yè)數(shù)： | 10/12頁(yè) |
| 文件大?。?/td> | 423K |
| 代理商： | HI5810 |
6-1786
The input will continue to track until the end of period 3, the
same as when free running.
Figure 2 illustrates the same operation as above but with an
external clock. If STRT is removed (at least t
R
STRT) before
clock period 2, a low signal applied to STRT will drop the
DRDY flag as before, and with the first positive going clock
edge that meets the (t
SU
STRT) setup time, the converter will
continue with clock period 3.
Clock
The HI5810 can operate either from its internal clock or from
one externally supplied. The CLK pin functions either as the
clock output or input. All converter functions are synchro-
nized with the rising edge of the clock signal.
Figure 16 shows the configuration of the internal clock. The
clock output drive is low power: if used as an output, it
should not have more than 1 CMOS gate load applied, and
stray wiring capacitance should be kept to a minimum.
The internal clock will shut down if the A/D is not restarted
after a conversion. The clock could also be shut down with
an open collector driver applied to the CLK pin. This should
only be done during the sample portion (the first three clock
periods) of a conversion cycle, and might be useful for using
the device as a digital sample and hold.
If an external clock is supplied to the CLK pin, it must have
sufficient drive to overcome the internal clock source. The
external clock can be shut off, but again, only during the
sample portion of a conversion cycle. At other times, it must
be above the minium frequency shown in the specifications.
In the above two cases, a further restriction applies in that
the clock should not be shut off during the third sample
period for more than 1ms. This might cause an internal
charge pump voltage to decay.
If the internal or external clock was shut off during the
conversion time (clock cycles 4 through 15) of the A/D, the
output might be invalid due to balancing capacitor droop.
An external clock must also meet the minimum t
LOW
and
t
HIGH
times shown in the specifications. A violation may
cause an internal miscount and invalidate the results.
Power Supplies and Grounding
V
DD
and V
SS
are the digital supply pins: they power all
internal logic and the output drivers. Because the output
drivers can cause fast current spikes in the V
DD
and V
SS
lines, V
SS
should have a low impedance path to digital
ground and V
DD
should be well bypassed.
Except for V
AA
+, which is a substrate connection to V
DD
, all
pins have protection diodes connected to V
DD
and V
SS
.
Input transients above V
DD
or below V
SS
will get steered to
the digital supplies.
The V
AA
+ and V
AA
- terminals supply the charge balancing
comparator only. Because the comparator is autobalanced
between conversions, it has good low frequency supply
rejection. It does not reject well at high frequencies however;
V
AA
- should be returned to a clean analog ground and V
AA
+
should be RC decoupled from the digital supply as shown in
Figure 17.
There is approximately 50
of substrate impedance
between V
DD
and V
AA
+. This can be used, for example, as
part of a low pass RC filter to attenuate switching supply
noise. A 10
μ
F capacitor from V
AA
+ to ground would
attenuate 30kHz noise by approximately 40dB. Note that
back-to-back diodes should be placed from V
DD
to V
AA
+ to
handle supply to capacitor turn-on or turn-off current spikes.
Dynamic Performance
Fast Fourier Transform (FFT) techniques are used to evalu-
ate the dynamic performance of the A/D. A low distortion
sine wave is applied to the input of the A/D converter. The
input is sampled by the A/D and its output stored in RAM.
The data is than transformed into the frequency domain with
a 4096 point FFT and analyzed to evaluate the converters
dynamic performance such as SNR and THD. See Typical
Performance Characteristics.
Signal-To-Noise Ratio
The signal to noise ratio (SNR) is the measured RMS signal to
RMS sum of noise at a specified input and sampling frequency.
The noise is the RMS sum of all except the fundamental and
the first five harmonic signals. The SNR is dependent on the
number of quantization levels used in the converter. The theo-
retical SNR for an N-bit converter with no differential or integral
linearity error is: SNR = (6.02N + 1.76)dB. For an ideal 12-bit
converter the SNR is 74dB. Differential and integral linearity
errors will degrade SNR.
Signal-To-Noise + Distortion Ratio
SINAD is the measured RMS signal to RMS sum of noise
plus harmonic power and is expressed by the following.
Effective Number of Bits
The effective number of bits (ENOB) is derived from the
SINAD data;
OPTIONAL
EXTERNAL
CLOCK
CLK
INTERNAL
ENABLE
100k
18pF
CLOCK
FIGURE 16. INTERNAL CLOCK CIRCUITRY
SNR = 10 Log
Sinewave Signal Power
Total Noise Power
SINAD = 10 Log
Sinewave Signal Power
Noise + Harmonic Power (2nd - 6th)
ENOB =
SINAD - 1.76
6.02
HI5810
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相關(guān)代理商/技術(shù)參數(shù) |
參數(shù)描述 |
|---|---|
| HI5810_01 | 制造商:INTERSIL 制造商全稱(chēng):Intersil Corporation 功能描述:CMOS 10 Microsecond, 12-Bit, Sampling A/D Converter with Internal Track and Hold |
| HI5810JIB | 制造商:INTERSIL 制造商全稱(chēng):Intersil Corporation 功能描述:CMOS 10 Microsecond, 12-Bit, Sampling A/D Converter with Internal Track and Hold |
| HI5810JIB-T | 制造商:INTERSIL 制造商全稱(chēng):Intersil Corporation 功能描述:CMOS 10 Microsecond, 12-Bit, Sampling A/D Converter with Internal Track and Hold |
| HI5810JIJ | 制造商:Rochester Electronics LLC 功能描述:- Bulk |
| HI5810JIP | 制造商:Rochester Electronics LLC 功能描述:- Bulk |
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