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參數(shù)資料
| 型號： | HCTS299DMSR |
| 廠商： | HARRIS SEMICONDUCTOR |
| 元件分類： | 通用總線功能 |
| 英文描述： | Radiation Hardened 8-Bit Universal Shift Register; Three-State |
| 中文描述： | HCT SERIES, 8-BIT BIDIRECTIONAL PARALLEL IN PARALLEL OUT SHIFT REGISTER, TRUE OUTPUT, CDIP20 |
| 文件頁數(shù)： | 7/13頁 |
| 文件大?。?/td> | 118K |
| 代理商： | HCTS299DMSR |
630
Specifications HCTS299MS
MR to Output
TPHL
VCC = 4.5V
+25
o
C
2
36
ns
OEn to Output
TPZH
VCC = 4.5V
+25
o
C
2
25
ns
TPHZ
2
27
ns
TPZL
VCC = 4.5V
+25
o
C
2
34
ns
TPLZ
2
34
ns
NOTES:
1. All voltages referenced to device GND.
2. AC measurements assume RL = 500
, CL = 50pF, Input TR =TF = 3ns, VIL = GND, VIH = 3V.
3. For functional tests VO
≥
4.0V is recognized as a logic “1”, and VO
≤
0.5V is recognized as a logic “0”.
TABLE 5. BURN-IN AND OPERATING LIFE TEST, DELTA PARAMETERS (+25
o
C)
PARAMETER
GROUP B
SUBGROUP
DELTA LIMIT
ICC
5
12
μ
A
IOL/IOH
5
-15% of 0 Hour
IOZL/IOZH
5
±
200nA
TABLE 6. APPLICABLE SUBGROUPS
CONFORMANCE GROUPS
METHOD
GROUP A SUBGROUPS
READ AND RECORD
Initial Test (Preburn-In)
100%/5004
1, 7, 9
ICC, IOL/H, IOZL/H
Interim Test
I
(Postburn-In)
100%/5004
1, 7, 9
ICC, IOL/H, IOZL/H
Interim Test
II
(Postburn-In)
100%/5004
1, 7, 9
ICC, IOL/H, IOZL/H
PDA
100%/5004
1, 7, 9, Deltas
Interim Test
III
(Postburn-In)
100%/5004
1, 7, 9
PDA
100%/5004
1, 7, 9, Deltas
Final Test
100%/5004
2, 3, 8A, 8B, 10, 11
Group A (Note 1)
Sample/5005
1, 2, 3, 7, 8A, 8B, 9, 10, 11
Group B
Subgroup B-5
Sample/5005
1, 2, 3, 7, 8A, 8B, 9, 10, 11, Deltas
Subgroups 1, 2, 3, 9, 10, 11
Subgroup B-6
Sample/5005
1, 7, 9
Group D
Sample/5005
1, 7, 9
NOTE: 1. Alternate Group A Inspection in accordance with Method 5005 of MIL-STD-883 may be exercised.
TABLE 4. DC POST RADIATION ELECTRICAL PERFORMANCE CHARACTERISTICS
PARAMETER
SYMBOL
(NOTES 1, 2)
CONDITIONS
TEMPERATURE
200K RAD
LIMITS
UNITS
MIN
MAX
Spec Number
518640
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