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參數(shù)資料
| 型號： | HCS283KMSR |
| 廠商： | INTERSIL CORP |
| 元件分類： | 通用總線功能 |
| 英文描述： | Radiation Hardened 4-Bit Full Adder with Fast Carry |
| 中文描述： | HC/UH SERIES, 4-BIT ADDER/SUBTRACTOR, CDFP16 |
| 封裝： | CERAMIC, DFP-16 |
| 文件頁數(shù)： | 6/9頁 |
| 文件大?。?/td> | 219K |
| 代理商： | HCS283KMSR |
6
Specifications HCS283MS
TABLE 6. APPLICABLE SUBGROUPS
CONFORMANCE GROUPS
METHOD
GROUP A SUBGROUPS
READ AND RECORD
Initial Test (Preburn-In)
100%/5004
1, 7, 9
ICC, IOL/H
Interim Test
I
(Postburn-In)
100%/5004
1, 7, 9
ICC, IOL/H
Interim Test
II
(Postburn-In)
100%/5004
1, 7, 9
ICC, IOL/H
PDA
100%/5004
1, 7, 9, Deltas
Interim Test
III
(Postburn-In)
100%/5004
1, 7, 9
ICC, IOL/H
PDA
100%/5004
1, 7, 9, Deltas
Final Test
100%/5004
2, 3, 8A, 8B, 10, 11
Group A (Note 1)
Sample/5005
1, 2, 3, 7, 8A, 8B, 9, 10, 11
Group B
Subgroup B-5
Sample/5005
1, 2, 3, 7, 8A, 8B, 9, 10, 11, Deltas
Subgroups 1, 2, 3, 9, 10, 11
Subgroup B-6
Sample/5005
1, 7, 9
Group D
Sample/5005
1, 7, 9
NOTE:
1. Alternate group A inspection in accordance with Method 5005 of MIL-STD-883 may be exercised.
TABLE 7. TOTAL DOSE IRRADIATION
CONFORMANCE
GROUPS
METHOD
TEST
READ AND RECORD
PRE RAD
POST RAD
PRE RAD
POST RAD
Group E Subgroup 2
5005
1, 7, 9
Table 4
1, 9
Table 4 (Note 1)
NOTE:
1. Except FN test which will be performed 100% Go/No-Go.
TABLE 8. STATIC AND DYNAMIC BURN-IN TEST CONNECTIONS
OPEN
GROUND
1/2 VCC = 3V
±
0.5V
VCC = 6V
±
0.5V
OSCILLATOR
50kHz
25kHz
STATIC BURN-IN I TEST CONNECTIONS (Note 1)
1, 4, 9, 10, 13
2, 3, 5 - 8, 11, 12, 14, 15
-
16
-
-
STATIC BURN-IN II TEST CONNECTIONS (Note 1)
1, 4, 9, 10, 13
8
-
2, 3, 5 - 7, 11, 12,
14, 15, 16
-
-
DYNAMIC BURN-IN TEST CONNECTIONS (Note 2)
-
8
1, 4, 9, 10, 13
16
2, 6, 7, 11, 15
3, 5, 12, 14
NOTES:
1. Each pin except VCC and GND will have a resistor of 10k
±
5% for static burn-in
2. Each pin except VCC and GND will have a resistor of 1k
±
5% for dynamic burn-in
TABEL 9. IRRADIATION TEST CONNECTIONS (T
A
= +25
o
C,
±
5
o
C)
OPEN
GROUND
VCC = 5V
±
0.5V
1, 4, 9, 10, 13
8
2, 3, 5 - 7, 11, 12, 14 - 16
NOTE: Each pin except VCC and GND will have a resistor of 47K
±
5% for irradiation testing.
Group E, Subgroup 2, sample size is 4 dice/wafer 0 failures.
Spec Number
518850
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相關代理商/技術參數(shù) |
參數(shù)描述 |
|---|---|
| HCS283MS | 制造商:INTERSIL 制造商全稱:Intersil Corporation 功能描述:Radiation Hardened 4-Bit Full Adder with Fast Carry |
| HCS300 | 制造商:MICROCHIP 制造商全稱:Microchip Technology 功能描述:Microchip Technology Inc. is a code hopping encoder designed |
| HCS300/P | 功能描述:編碼器、解碼器、復用器和解復用器 2-6.3V RoHS:否 制造商:Micrel 產(chǎn)品:Multiplexers 邏輯系列:CMOS 位數(shù): 線路數(shù)量（輸入/輸出）:2 / 12 傳播延遲時間:350 ps, 400 ps 電源電壓-最大:2.625 V, 3.6 V 電源電壓-最小:2.375 V, 3 V 最大工作溫度:+ 85 C 安裝風格:SMD/SMT 封裝 / 箱體:QFN-44 封裝:Tray |
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| HCS300/SN | 功能描述:編碼器、解碼器、復用器和解復用器 2-6.3V RoHS:否 制造商:Micrel 產(chǎn)品:Multiplexers 邏輯系列:CMOS 位數(shù): 線路數(shù)量（輸入/輸出）:2 / 12 傳播延遲時間:350 ps, 400 ps 電源電壓-最大:2.625 V, 3.6 V 電源電壓-最小:2.375 V, 3 V 最大工作溫度:+ 85 C 安裝風格:SMD/SMT 封裝 / 箱體:QFN-44 封裝:Tray |
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