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參數(shù)資料
| 型號： | HCS273MS |
| 廠商： | Intersil Corporation |
| 英文描述： | Radiation Hardened Octal D-Type Flip-Flop(抗輻射八D觸發(fā)器) |
| 中文描述： | 輻射加固八路D類觸發(fā)器（抗輻射八?觸發(fā)器） |
| 文件頁數(shù)： | 6/9頁 |
| 文件大小： | 139K |
| 代理商： | HCS273MS |
341
Specifications HCS273MS
TABLE 6. APPLICABLE SUBGROUPS
CONFORMANCE GROUPS
METHOD
GROUP A SUBGROUPS
READ AND RECORD
Initial Test (Preburn-In)
100%/5004
1, 7, 9
ICC, IOL/H
Interim Test
I
(Postburn-In)
100%/5004
1, 7, 9
ICC, IOL/H
Interim Test
II
(Postburn-In)
100%/5004
1, 7, 9
ICC, IOL/H
PDA
100%/5004
1, 7, 9, Deltas
Interim Test
III
(Postburn-In)
100%/5004
1, 7, 9
ICC, IOL/H
PDA
100%/5004
1, 7, 9, Deltas
Final Test
100%/5004
2, 3, 8A, 8B, 10, 11
Group A (Note 1)
Sample/5005
1, 2, 3, 7, 8A, 8B, 9, 10, 11
Group B
Subgroup B-5
Sample/5005
1, 2, 3, 7, 8A, 8B, 9, 10, 11, Deltas
Subgroups 1, 2, 3, 9, 10, 11,
(Note 2)
Subgroup B-6
Sample/5005
1, 7, 9
Group D
Sample/5005
1, 7, 9
NOTES:
1. Alternate Group A testing in accordance with Method 5005 of Mil-Std-883 may be exercised.
2. Table 5 parameters only.
TABLE 7. TOTAL DOSE IRRADIATION
CONFORMANCE
GROUPS
METHOD
TEST
READ AND RECORD
PRE RAD
POST RAD
PRE RAD
POST RAD
Group E Subgroup 2
5005
1, 7, 9
Table 4
1, 9
Table 4 (Note 1)
NOTE: Except FN test which will be performed 100% Go/No-Go.
TABLE 8. STATIC AND DYNAMIC BURN-IN TEST CONNECTIONS
OPEN
GROUND
1/2 VCC = 3V
±
0.5V
VCC = 6V
±
0.5V
OSCILLATOR
50kHz
25kHz
STATIC I BURN-IN (Note 1)
2, 5, 6, 9, 12, 15, 16, 19
1, 3, 4, 7, 8, 10, 11,
13, 14, 17, 18
-
20
-
-
STATIC II BURN-IN (Note 1)
2, 5, 6, 9, 12, 15, 16, 19
10
-
1, 3, 4, 7, 8, 11, 13,
14, 17, 18, 20
-
-
DYNAMIC BURN-IN (Note 2)
-
10
2, 5, 6, 9, 12, 15, 16, 19
1, 20
11
3, 4, 7, 8, 13,
14, 17, 18
NOTES:
1. Each pin except VCC and GND will have a resistor of 10K
±
5% for static burn-in
2. Each pin except VCC and GND will have a resistor of 680
±
5% for dynamic burn-in
TABLE 9. IRRADIATION TEST CONNECTIONS
OPEN
GROUND
VCC = 5V
±
0.5V
2, 5, 6, 9, 12, 15, 16, 19
10
1, 3, 4, 7, 8, 11, 13, 14, 17, 18, 20
NOTE: Each pin except VCC and GND will have a resistor of 47K
±
5% for irradiation testing.
Group E, Subgroup 2, sample size is 4 dice/wafer 0 failures.
Spec Number
518767
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