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參數(shù)資料
| 型號(hào)： | HCS08MS |
| 廠商： | Intersil Corporation |
| 英文描述： | Radiation Hardened Quad 2-Input AND Gate(抗輻射四2輸入與門) |
| 中文描述： | 輻射加固四2輸入與門（抗輻射四2輸入與門） |
| 文件頁數(shù)： | 4/8頁 |
| 文件大?。?/td> | 126K |
| 代理商： | HCS08MS |
4
Specifications HCS08MS
Noise Immunity
Functional Test
FN
VCC = 4.5V, VIH = 0.70(VCC),
VIL = 0.30(VCC) at 200K RAD, (Note 3)
+25
o
C
-
-
-
Input to Yn
TPHL
VCC = 4.5V
+25
o
C
2
18
ns
TPLH
VCC = 4.5V
+25
o
C
2
20
ns
NOTES:
1. All voltages referenced to device GND.
2. AC measurements assume RL = 500
, CL = 50pF, Input TR = TF = 3ns, VIL = GND, VIH = VCC.
3. For functional tests, VO
≥
4.0V is recognized as a logic “1”, and VO
≤
0.5V is recognized as a logic “0”.
TABLE 5. BURN-IN AND OPERATING LIFE TEST, DELTA PARAMETERS (+25
o
C)
PARAMETER
GROUP B
SUBGROUP
DELTA LIMIT
ICC
5
3
μ
A
IOL/IOH
5
-15% of 0 Hour
TABLE 6. APPLICABLE SUBGROUPS
COMFORMANCE GROUP
MIL-STD-883 METHOD
GROUP A SUBGROUPS
TESTED
RECORDED
Initial Test
100% 5004
1, 7, 9
1 (Note 2)
Interim Test
100% 5004
1, 7, 9,
1,
(Note 2)
PDA
100% 5004
1, 7,
Final Test
100% 5004
2, 3, 8A, 8B, 10, 11
Group A (Note 1)
Sample 5005
1, 2, 3, 7, 8A, 8B, 9, 10, 11
Subgroup B5
Sample 5005
1, 2, 3, 7, 8A, 8B, 9, 10, 11,
1, 2, 3,
(Note 2)
Subgroup B6
Sample 5005
1, 7, 9
Group D
Sample 5005
1, 7, 9
NOTES:
1. Alternate Group A testing in accordance with MIL-STD-883 Method 5005 may be exercised.
2. Table 5 parameters only.
TABLE 7. TOTAL DOSE IRRADIATION
CONFORMANCE
GROUPS
METHOD
TEST
READ AND RECORD
PRE RAD
POST RAD
PRE RAD
POST RAD
Group E Subgroup 2
5005
1, 7, 9
Table 4
1, 9
Table 4 (Note 1)
NOTE:
1. Except FN test which will be performed 100% Go/No-Go.
TABLE 4. DC POST RADIATION ELECTRICAL PERFORMANCE CHARACTERISTICS (Continued)
PARAMETERS
SYMBOL
(NOTES 1, 2)
CONDITIONS
TEMPERATURE
200K RAD LIMITS
UNITS
MIN
MAX
Spec Number
518746
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