參數(shù)資料
型號(hào): HCPL0638
廠商: FAIRCHILD SEMICONDUCTOR CORP
元件分類(lèi): 光電耦合器
英文描述: High Speed-10 MBit/s Logic Gate Optocouplers
中文描述: 2 CHANNEL LOGIC OUTPUT OPTOCOUPLER, 10 Mbps
封裝: LEAD FREE, COMPACT, SOP-8
文件頁(yè)數(shù): 5/17頁(yè)
文件大?。?/td> 717K
代理商: HCPL0638
5
www.fairchildsemi.com
HCPL06XX Rev. 1.0.7
H
Transfer Characteristics
(T
A
= -40°C to +85°C Unless otherwise specified.)
Isolation Characteristics
(T
A
= -40°C to +85°C Unless otherwise specified.)
Symbol
Characteristics
** All typical values are at V
CC
= 5 V, T
A
= 25°C
Notes:
1.
The V
supply to each optoisolator must be bypassed by a 0.1μF capacitor or larger. This can be either a ceramic or solid
tantalum capacitor with good high frequency characteristic and should be connected as close as possible to the package V
CC
and
GND pins of each device.
2.
Enable Input – No pull up resistor required as the device has an internal pull up resistor.
3.
t
– Propagation delay is measured from the 3.75 mA level on the HIGH to LOW transition of the input current pulse to the 1.5V
level on the LOW to HIGH transition of the output voltage pulse.
4.
t
– Propagation delay is measured from the 3.75 mA level on the LOW to HIGH transition of the input current pulse to the 1.5V
level on the HIGH to LOW transition of the output voltage pulse.
5. t
r
– Rise time is measured from the 90% to the 10% levels on the LOW to HIGH transition of the output pulse.
6.
t
f
– Fall time is measured from the 10% to the 90% levels on the HIGH to LOW transition of the output pulse.
7.
t
– Enable input propagation delay is measured from the 1.5V level on the HIGH to LOW transition of the input voltage pulse
to the 1.5V level on the LOW to HIGH transition of the output voltage pulse.
8.
t
– Enable input propagation delay is measured from the 1.5V level on the LOW to HIGH transition of the input voltage pulse
to the 1.5V level on the HIGH to LOW transition of the output voltage pulse.
9.
CM
H
– The maximum tolerable rate of rise of the common mode voltage to ensure the output will remain in the high state (i.e.,
V
OUT
> 2.0 V). Measured in volts per microsecond (V/μs).
10. CM
– The maximum tolerable rate of fall of the common mode voltage to ensure the output will remain in the low output state
(i.e., V
OUT
< 0.8 V). Measured in volts per microsecond (V/μs).
11. Device considered a two-terminal device: Pins 1,2,3 and 4 shorted together, and Pins 5,6,7 and 8 shorted together.
Symbol
DC Characteristics
Test Conditions
Min.
Typ.**
Max.
Unit
I
OH
High Level Output Current
V
CC
= 5.5V, V
O
= 5.5 V, I
F
= 250μA,
V
E
= 2.0V
(2)
V
CC
= 5.5V, I
F
= 5mA, V
E
= 2.0V,
I
OL
= 13mA
(2)
V
CC
= 5.5V, V
O
= 0.6V, V
E
= 2.0V,
I
OL
= 13mA
100
μA
V
OL
Low Level Output Voltage
0.6
V
I
FT
Input Threshold Current
5
mA
Test Conditions
Min.
Typ.**
Max.
Unit
I
I-O
Input-Output
Insulation Leakage Current
Relative humidity = 45%,
T
A
= 25°C, t = 5s,
V
I-O
= 3000 VDC
(11)
R
H
< 50%, T
A
= 25°C,
I
I-O
2μA, t = 1 min.
(11)
V
I-O
= 500V
(11)
f = 1MHz
(11)
1.0*
μA
V
ISO
Withstand Insulation Test Voltage
3750
V
RMS
R
I-O
C
I-O
Resistance (Input to Output)
10
12
Capacitance (Input to Output)
0.6
pF
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