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3-127
Spec Number
511015-883
Specifications HA-5114/883
Slew Rate
+SR
V
OUT
= -5V to +5V
V
OUT
= +5V to -5V
V
PEAK
= 10V
R
L
= 2k
, C
L
= 50pF
1
+25
o
C
+25
o
C
+25
o
C
12
-
V/
μ
s
-SR
1
12
-
V/
μ
s
Full Power Bandwidth
FPBW
1, 2
191
-
kHz
Minimum Closed Loop
Stable Gain
CLSG
1
-55
o
C to +125
o
C
10
-
V/V
Rise and Fall Time
t
R
t
F
V
OUT
= 0V to +200mV
V
OUT
= 0V to -200mV
V
OUT
= 0V to +200mV
V
OUT
= 0V to -200mV
Open Loop
1, 4
+25
o
C
+25
o
C
+25
o
C
+25
o
C
+25
o
C
-
100
ns
1, 4
-
100
ns
Overshoot
+OS
1
-
40
%
-OS
1
-
40
%
Output Resistance
R
OUT
PC
1
-
270
Quiescent Power
Consumption
V
OUT
= 0V, I
OUT
= 0mA
1, 3
-55
o
C to +125
o
C
-
225
mW
Channel Separation
CS
R
S
= 1k
,
A
VCL
= 100V/V,
V
IN
= 100mV
PEAK
at
10kHz Referred to
Input
1
+25
o
C
55
-
dB
NOTES:
1. Parameters listed in Table 3 are controlled via design or process parameters and are not directly tested at final production. These param-
eters are lab characterized upon initial design release, or upon design changes. These parameters are guaranteed by characterization
based upon data from multiple production runs which reflect lot to lot and within lot variation.
2. Full Power Bandwidth guarantee based on Slew Rate measurement using FPBW = Slew Rate/(2
π
V
PEAK
).
3. Quiescent Power Consumption based upon Quiescent Supply Current test maximum. (No load on outputs.).
4. Measured between 10% and 90% points.
TABLE 4. ELECTRICAL TEST REQUIREMENTS
MIL-STD-883 TEST REQUIREMENTS
SUBGROUPS (SEE TABLE 1)
Interim Electrical Parameters (Pre Burn-In)
1
Final Electrical Test Parameters
1 (Note 1), 2, 3, 4, 5, 6
Group A Test Requirements
1, 2, 3, 4, 5, 6
Groups C and D Endpoints
1
NOTE:
1. PDA applies to Subgroup 1 only.
TABLE 3. ELECTRICAL PERFORMANCE CHARACTERISTICS (Continued)
Device Characterized at: V
SUPPLY
=
±
15V, R
LOAD
= 2k
, C
LOAD
= 50pF, A
VCL
= 10V/V, Unless Otherwise Specified.
PARAMETERS
SYMBOL
CONDITIONS
NOTES
TEMPERATURE
LIMITS
UNITS
MIN
MAX