參數(shù)資料
型號: GS841Z36CGT-166IT
廠商: GSI TECHNOLOGY
元件分類: SRAM
英文描述: 128K X 36 ZBT SRAM, 7 ns, PQFP100
封裝: ROHS COMPLIANT, TQFP-100
文件頁數(shù): 23/28頁
文件大?。?/td> 250K
代理商: GS841Z36CGT-166IT
GS841Z18CGT/GS841Z36CGT
Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com.
Rev: 1.01 8/2011
4/28
2011, GSI Technology
100-Pin TQFP Pin Descriptions
Symbol
Type
Description
A0, A1
In
Burst Address Inputs—Preload the burst counter
A
In
Address Inputs
CK
In
Clock Input Signal
BA
In
Byte Write signal for data inputs DQA1–DQA9; active low
BB
In
Byte Write signal for data inputs DQB1–DQB9; active low
BC
In
Byte Write signal for data inputs DQC1–DQC9; active low
BD
In
Byte Write signal for data inputs DQD1–DQD9; active low
W
In
Write Enable; active low
E1
In
Chip Enable; active low
E2
In
Chip Enable; active high; for self decoded depth expansion
E3
In
Chip Enable; active low; for self decoded depth expansion
G
In
Output Enable; active low
ADV
In
Advance / Load—Burst address counter control pin
CKE
In
Clock Input Buffer Enable; active low
NC
No Connect
DQA
I/O
Byte A Data Input and Output pins
DQB
I/O
Byte B Data Input and Output pins
DQC
I/O
Byte C Data Input and Output pins
DQD
I/O
Byte D Data Input and Output pins
ZZ
In
Power down control; active high
FT
In
Pipeline/Flow Through Mode Control; active low
LBO
In
Linear Burst Order; active low
TMS
Scan Test Mode Select
TDI
Scan Test Data In
TDO
Scan Test Data Out
TCK
Scan Test Clock
VDD
In
3.3 V power supply
VSS
In
Ground
VDDQ
In
3.3 V output power supply for noise reduction
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