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GS841E18AT/B-180/166/150/130/100
256K x 18 Sync
Cache Tag
180 MHz–100 MHz
3.3 V V
DD
3.3 V and 2.5 V I/O
TQFP, BGA
Commercial Temp
Industrial Temp
Rev: 1.03 4/2005
Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com.
* Pentium is a trademark of Intel
1/21
2001, GSI Technology
Features
3.3 V +10%/–5% core power supply, 2.5 V or 3.3 V I/O
supply
Dual Cycle Deselect (DCD)
Intergrated data comparator for Tag RAM application
FT mode pin for flow through or pipeline operation
LBO pin for Linear or Interleave (Pentium
TM
and X86) Burst
mode
Synchronous address, data I/O, and control inputs
Synchronous Data Enable (DE)
Asynchronous Output Enable (OE)
Asynchronous Match Output Enable (MOE)
Byte Write (BWE) and Global Write (GW) operation
Three chip enable signals for easy depth expansion
Internal self-timed write cycle
JTAG Test mode conforms to IEEE standard 1149.1
JEDEC-standard 100-lead TQFP package and 119-BGA
Pb-Free 100-lead TQFP package available
Functional Description
The GS841E18A is a 256K x 18 high performance synchronous DCD
SRAM with integrated Tag RAM comparator. A 2-bit burst counter is
included to provide burst interface with Pentium
TM
and other high
performance CPUs. It is designed to be used as a Cache Tag SRAM,
as well as data SRAM. Addresses, data IOs, match output, chip
enables (CE1, CE2, CE3), address control inputs (ADSP, ADSC,
ADV), and write control inputs (BW1, BW2, BWE, GW, DE) are
synchronous and are controlled by a positive-edge-triggered clock
(CLK).
Output Enable (OE), Match Output Enable, and power down control
(ZZ) are asynchronous. Burst can be initiated with either ADSP or
ADSC inputs. Subsequent burst addresses are generated internally and
are controlled by ADV. The burst sequence is either interleave order
(Pentium
TM
or x86) or linear order, and is controlled by LBO.
Output registers and the Match output register are provided and
controlled by the FT mode pin (Pin 14). Through use of the FT mode
pin, I/O registers can be programmed to perform pipeline or flow
through operation. Flow Through mode reduces latency.
Byte write operation is performed by using Byte Write Enable (BWE)
input combined with two individual byte write signals BW1-2. In
addition, Global Write (GW) is available for writing all bytes at one
time.
Compare cycles begin as a read cycle with output disabled so that
compare data can be loaded into the data input register. The
comparator compares the read data with the registered input data and a
match signal is generated. The match output can be either in Pipeline
or Flow Through modes controlled by the FT signal.
Low power (Standby mode) is attained through the assertion of the ZZ
signal, or by stopping the clock (CLK). Memory data is retained
during Standby mode.
JTAG boundary scan interface is provided using IEEE standard
1149.1 protocol. Four pins—Test Data In (TDI), Test Data Out
(TDO), Test Clock (TCK) and Test Mode Select (TMS)—are used to
perform JTAG function.
The GS841E18A operates on a 3.3 V power supply and all inputs/
outputs are 3.3 V- or 2.5 V-LVTTL-compatible. Separate output
(V
DDQ
) pins are used to allow both 3.3 V or 2.5 V IO interface.
Dual Cycle Deselect (DCD)
The GS841E18A is a DCD pipelines synchronous SRAM. DCD
SRAMs pipeline disable commands to the same degree as read
commands. DCD SRAMs hold the deselect command for one full
cycle and then begin turning off their outputs just after the second
rising edge of the clock.
Parameter Synopsis
–180
-166
-150
-133
-100
Pipeline
3-1-1-1
t
cycle
t
KQ
I
DD
5.5 ns
3.2 ns
335 mA
6.0 ns
3.5 ns
310 mA
6.6 ns
3.8 ns
275 mA
7.5 ns
4.0 ns
250 mA
10 ns
4.5 ns
190 mA
Flow
Through
2-1-1-1
t
KQ
t
cycle
I
DD
8 ns
9.1 ns
210 mA
8.5 ns
10 ns
190 mA
10 ns
10 ns
190 mA
11 ns
15 ns
140 mA
12 ns
15 ns
140 mA