• 參數(shù)資料
    型號: FSGYC164D1
    英文描述: TRANSISTOR | MOSFET | N-CHANNEL | 150V V(BR)DSS | 69A I(D) | SMT
    中文描述: 晶體管| MOSFET的| N溝道| 150伏五(巴西)直| 69A條(?。﹟貼片
    文件頁數(shù): 1/7頁
    文件大?。?/td> 109K
    代理商: FSGYC164D1
    2001 Fairchild Semiconductor Corporation
    FSGYC063R Rev. B
    FSGYC063R
    Radiation Hardened, SEGR Resistant
    N-Channel Power MOSFETs
    Fairchild Star*Power Rad Hard
    MOSFETs have been specifically
    developed for high performance
    applications in a commercial or
    military space environment.
    Star*Power MOSFETs offer the system designer both
    extremely low r
    DS(ON)
    and Gate Charge allowing the
    development of low loss Power Subsystems. Star*Power
    Gold FETs combine this electrical capability with total dose
    radiation hardness up to 100K RADs while maintaining the
    guaranteed performance for Single Event Effects (SEE)
    which the Fairchild FS families have always featured.
    The Fairchild family of Star*Power FETs includes a series of
    devices in various voltage, current and package styles. The
    portfolio consists of Star*Power and Star*Power Gold
    products. Star*Power FETs are optimized for total dose and
    r
    DS(ON)
    while exhibiting SEE capability at full rated voltage
    up to an LET of 37. Star*Power Gold FETs have been
    optimized for SEE and Gate Charge combining SEE
    performance to 80% of the rated voltage for an LET of 82
    with extremely low gate charge characteristics.
    This MOSFET is an enhancement-mode silicon-gate power
    field effect transistor of the vertical DMOS (VDMOS)
    structure. It is specifically designed and processed to be
    radiation tolerant. The MOSFET is well suited for
    applications exposed to radiation environments such as
    switching regulation, switching converters, power
    distribution, motor drives and relay drivers as well as other
    power control and conditioning applications. As with
    conventional MOSFETs these Radiation Hardened
    MOSFETs offer ease of voltage control, fast switching
    speeds and ability to parallel switching devices.
    Reliability screening is available as either TXV or Space
    equivalent of MIL-PRF-19500.
    Formerly available as type TA45223W.
    Features
    70A
    , 30V, r
    DS(ON)
    = 0.004
    UIS Rated
    Total Dose
    - Meets Pre-RAD Specifications to 100K RAD (Si)
    Single Event
    - Safe Operating Area Curve for Single Event Effects
    - SEE Immunity for LET of 82MeV/mg/cm
    2
    with
    V
    DS
    up to 80% of Rated Breakdown
    Dose Rate
    - Typically Survives 3E9 RAD (Si)/s at 80% BV
    DSS
    - Typically Survives 2E12 if Current Limited to I
    AS
    Photo Current
    - 3nA Per-RAD (Si)/s Typically
    Neutron
    - Maintain Pre-RAD Specifications
    for 3E13 Neutrons/cm
    2
    - Usable to 3E14 Neutrons/cm
    2
    Symbol
    Packaging
    SMD2
    Current is limited by the package capability
    Ordering Information
    RAD LEVEL
    SCREENING LEVEL
    PART NUMBER/BRAND
    10K
    Engineering samples
    FSGYC063D1
    100K
    TXV
    FSGYC063R3
    100K
    Space
    FSGYC063R4
    TM
    D
    G
    S
    Data Sheet
    December 2001
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    參數(shù)描述
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