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| 型號： | EVAL-AD5405EBZ |
| 廠商： | Analog Devices Inc |
| 文件頁數(shù)： | 23/25頁 |
| 文件大?。?/td> | 0K |
| 描述： | BOARD EVAL FOR AD5405 |
| 產(chǎn)品培訓(xùn)模塊： | DAC Architectures |
| 標(biāo)準(zhǔn)包裝： | 1 |
| DAC 的數(shù)量： | 2 |
| 位數(shù)： | 12 |
| 采樣率（每秒）： | 21.3M |
| 數(shù)據(jù)接口： | 并聯(lián) |
| 設(shè)置時(shí)間： | 80ns |
| DAC 型： | 電流 |
| 工作溫度： | -40°C ~ 125°C |
| 已供物品： | 板 |
| 已用 IC / 零件： | AD5405 |
AD5405
Rev. B | Page 6 of 24
ABSOLUTE MAXIMUM RATINGS
Transient currents of up to 100 mA do not cause SCR latch-up.
TA = 25°C, unless otherwise noted.
Table 3.
Parameter
Rating
VDD to GND
0.3 V to +7 V
VREFA, VREFB, RFBA, RFBB to GND
12 V to +12 V
IOUT1, IOUT2 to GND
0.3 V to +7 V
Logic Inputs and Output1
0.3 V to VDD + 0.3 V
Operating Temperature Range
Automotive (Y Version)
40°C to +125°C
Storage Temperature Range
65°C to +150°C
Junction Temperature
150°C
40-lead LFCSP, θJA Thermal Impedance
30°C/W
Lead Temperature, Soldering (10 sec)
300°C
IR Reflow, Peak Temperature (<20 sec)
235°C
1 Overvoltages at DBx, LDAC, CS, and R/W are clamped by internal diodes.
Stresses above those listed under Absolute Maximum Ratings
may cause permanent damage to the device. This is a stress
rating only; functional operation of the device at these or any
other conditions above those indicated in the operational
section of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect
device reliability.
ESD CAUTION
ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily accumulate on
the human body and test equipment and can discharge without detection. Although this product features
proprietary ESD protection circuitry, permanent damage may occur on devices subjected to high energy
electrostatic discharges. Therefore, proper ESD precautions are recommended to avoid performance
degradation or loss of functionality.
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