參數(shù)資料
型號: ET80960JT10016
廠商: Intel
文件頁數(shù): 40/86頁
文件大?。?/td> 0K
描述: IC MPU I960JT 3V 100MHZ 132-QFP
標(biāo)準(zhǔn)包裝: 1
處理器類型: i960
特點(diǎn): 后綴 JT,32 位 16K 高速緩沖
速度: 100MHz
電壓: 3V
安裝類型: 表面貼裝
封裝/外殼: 132-QFP
供應(yīng)商設(shè)備封裝: 132-QFP
包裝: 托盤
其它名稱: 864017
80960JA/JF/JD/JS/JC/JT 3.3 V Embedded 32-Bit Microprocessor
Datasheet
45
4.7.1
A.C. Test Conditions and Derating Curves
The A.C. Specifications in Section 4.7, “A.C. Specifications” are tested with the 50 pF load
indicated in Figure 10.
Refer to the following sections for the specified derating curves:
Table 23. Note Definitions for Table 22, 80960Jx AC Characteristics
NOTES:
1. Not tested.
2. To ensure a 1:1 relationship between the amplitude of the input jitter and the internal clock, the jitter
frequency spectrum should not have any power peaking between 500 KHz and 1/3 of the CLKIN
frequency.
3. Inactive ALE/ALE# refers to the falling edge of ALE and the rising edge of ALE#. For inactive ALE/ALE#
timings, refer to Relative Output Timings in this table.
4. A float condition occurs when the output current becomes less than IOL. Float delay is not tested, but is
designed to be no longer than the valid delay.
5. AD[31:0] are synchronous inputs. Setup and hold times must be met for proper processor operation. NMI#
and XINT[7:0]# may be synchronous or asynchronous. Meeting setup and hold time guarantees
recognition at a particular clock edge. For asynchronous operation, NMI# and XINT[7:0]# must be asserted
for a minimum of two CLKIN periods to ensure recognition.
6. RDYRCV# and HOLD are synchronous inputs. Setup and hold times must be met for proper processor
operation.
7. RESET# may be synchronous or asynchronous. Meeting setup and hold time guarantees recognition at a
particular clock edge.
8. ONCE# and STEST# must be stable at the rising edge of RESET# for proper operation.
9. Guaranteed by design. May not be 100% tested.
10.Relative to falling edge of TCK.
11. Worst-case TOV condition occurs on I/O pins when pins transition from a floating high input to driving a low
output state. The Address/Data Bus pins encounter this condition between the last access of a read, and
the address cycle of a following write. 5 V signals take 3 ns longer to discharge than 3.3 V signals at 50 pF
loads.
Figure 10. A.C. Test Load
Output Pin
CL = 50 pF for all signals
CL
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