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參數(shù)資料
| 型號(hào)： | ECCM2RA08-38.400M |
| 廠商： | ECLIPTEK CORP |
| 元件分類： | 晶體 |
| 英文描述： | QUARTZ CRYSTAL RESONATOR, 38.4 MHz |
| 封裝： | ROHS COMPLIANT, CERAMIC, SMD, 4 PIN |
| 文件頁(yè)數(shù)： | 1/4頁(yè) |
| 文件大?。?/td> | 121K |
| 代理商： | ECCM2RA08-38.400M |
Pb
RoHS
ECCM2RA08-38.400M
ECCM2 R A 08 -38.400M
Series
RoHS Compliant (Pb-free) 2.0mm x 2.5mm 4 Pad
Ceramic SMD Crystal
Frequency Tolerance/Stability
±10ppm at 25°C, ±10ppm over -10°C to +60°C
Mode of Operation
AT-Cut Fundamental
Nominal Frequency
38.400MHz
Load Capacitance
8pF Parallel Resonant
ELECTRICAL SPECIFICATIONS
Nominal Frequency
38.400MHz
Frequency Tolerance/Stability
±10ppm at 25°C, ±10ppm over -10°C to +60°C
Aging at 25°C
±3ppm/year Maximum
Load Capacitance
8pF Parallel Resonant
Shunt Capacitance (C0)
5pF Maximum
Equivalent Series Resistance
60 Ohms Maximum
Mode of Operation
AT-Cut Fundamental
Drive Level
100Watts Maximum
Spurious Response
-3dB Minimum; Fo to Fo +5000ppm
Storage Temperature Range
-40°C to +90°C
Insulation Resistance
500 Megaohms Minimum at 100Vdc
ENVIRONMENTAL & MECHANICAL SPECIFICATIONS
ESD Susceptibility
MIL-STD-883, Method 3015, Class 1, HBM: 1500V
Fine Leak Test
MIL-STD-883, Method 1014, Condition A
Flammability
UL94-V0
Gross Leak Test
MIL-STD-883, Method 1014, Condition C
Mechanical Shock
MIL-STD-883, Method 2002, Condition B
Moisture Resistance
MIL-STD-883, Method 1004
Moisture Sensitivity
J-STD-020, MSL 1
Resistance to Soldering Heat
MIL-STD-202, Method 210, Condition K
Resistance to Solvents
MIL-STD-202, Method 215
Solderability
MIL-STD-883, Method 2003
Temperature Cycling
MIL-STD-883, Method 1010, Condition B
Vibration
MIL-STD-883, Method 2007, Condition A
MECHANICAL DIMENSIONS (all dimensions in millimeters)
2.50
±0.10
2.00
±0.10
0.55 MAX
0.65 ±0.10
0.95
±0.10
MARKING
ORIENT
A
TION
1
2
3
4
0.675 ±0.100
(X4)
0.775
±0.100
(X4)
PIN
CONNECTION
1
Crystal
2
Cover/Ground
3
Crystal
4
Cover/Ground
LINE MARKING
1
38.4
2
YZZ
Y=Last Digit of Year
ZZ=Week of the Year
www.ecliptek.com | Specification Subject to Change Without Notice | Rev B 8/12/2010 | Page 1 of 4
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