參數(shù)資料
型號: E819-EDGE819
英文描述: Octal 18 V Pin Electronics Driver
中文描述: 八路18 V引腳電子驅動器
文件頁數(shù): 7/11頁
文件大小: 84K
代理商: E819-EDGE819
5
2000 Semtech Corp.
www.semtech.com
HIGH-PERFORMANCE PRODUCTS – ATE
Edge819
PRELIMINARY
Application Information
Power Supply Decoupling
VCC and VEE should be decoupled to GND with a .1
F
chip capacitor in parallel with a .001
F chip capacitor. A
VCC and VEE plane, or at least a solid power bus, is
recommended for optimal performance.
VH and VL Decoupling
As the VH and VL inputs are unbuffered and supply the
driver output current, which can be quite large during edge
transitions, decoupling capacitors for these inputs are
recommended in proportion to the amount of output
current requirements.
For applications where VH and VL are shared over multiple
channels, a solid power plane to distribute these levels is
preferred.
VBB
The two VBB pins are connected together on-chip.
Therefore, only one VBB needs to be connected to for
proper 819 operation.
The two pins may be used to daisy chain a VBB signal
across a PC Board without having to route the actual signal
underneath the 819.
Latchup Protection
The Edge819 has several power supply requirements to
protect the part in power supply fault situations, as well
as during power up and power down sequences. VCC
must remain greater than or equal to VDD (external supply
for the digital logic) at all times. Both VCC and VDD must
always be positive (above ground), and VEE must always
be negative (at or below ground).
The three diode configuration shown in Figure 1 should
be used on a once-per-board basis.
Figure 1.
Power Supply Protection Scheme
Warning: It is extremely important that the voltage on any
device pin does not exceed the range of VEE –0.5V to VCC
+0.5V at any time, either during power up, normal
operation, or during power down. Failure to adhere to this
requirement could result in latchup of the device, which
could be destructive if the system power supplies are
capable of supplying large amounts of current. Even if the
device is not immediately destroyed, the cumulative
damage caused by the stress of repeated latchup may
affect device reliability.
VCC
VDD
VEE
1N5820 or
Equivalent
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