PART NUMBERING GUIDE
E1S A A 18 - 20.000M TR
MECHANICAL DIMENSIONS
ALL DIMENSIONS IN MILLIMETERS
TAPE AND REEL DIMENSIONS
ALL DIMENSIONS IN MILLIMETERS
MARKING SPECIFICATIONS
ENVIRONMENTAL/MECHANICAL SPECIFICATIONS
MANUFACTURER
ECLIPTEK CORP.
CATEGORY
CRYSTAL
SERIES
PACKAGE
CLASS
REV
.
DATE
E1S
HC-49/UP Short
CR43 08/05
Coplanarity: 0.36mm Maximum
Line 1: E XX.XXX M
Frequency in MHz
(5 Digits Maximum + Decimal)
PACKAGING OPTIONS
Blank=Bulk, TR=Tape and Reel
FREQUENCY
LOAD CAPACITANCE
S=Series
XX=XXpF (Custom)
MODE OF OPERATION / CRYSTAL CUT
A=Fundamental / AT,
B=Third Overtone / AT
D=Fundamental / BT
SUGGESTED SOLDER PAD LAYOUT
ALL DIMENSIONS IN MILLIMETERS
Tolerances = ±0.2
1. 5 MIN 50 MIN 20.2 MIN 13±.2 40 MIN
R S T U V
QTY/REEL
2.5 MIN
10 MIN 30.4 MAX 360 MAX 24.4+2-0 1,000
M N O P Q
REEL
F G H J K L
12±.2 B0* 1.5 +.1 A0* .4±.1 K0*
A B C D E
24±.3 11.5±.1 1 0.75±.1 4 ±.2 2±.1
TAPE
*Compliant to EIA-481A
800-ECLIPTEK www.ecliptek.com for latest revision
Specifications subject to change without notice.
FREQUENCY TOLERANCE / STABILITY
A=±50ppm at 25°C, ±100ppm from 0°C to 70°C
B=±50ppm at 25°C, ±100ppm from -20°C to 70°C
C=±50ppm at 25°C, ±100ppm from -40°C to 85°C
D=±30ppm at 25°C, ±50ppm from 0°C to 70°C
E=±30ppm at 25°C, ±50ppm from -20°C to 70°C
F=±30ppm at 25°C, ±50ppm from -40°C to 85°C
G=±15ppm at 25°C, ±30ppm from 0°C to 70°C
H=±15ppm at 25°C, ±30ppm from -20°C to 70°C
J=±15ppm at 25°C, ±30ppm from -40°C to 85°C
K=±15ppm at 25°C, ±20ppm from 0°C to 70°C
L=±15ppm at 25°C, ±20ppm from -20°C to 70°C
M=±15ppm at 25°C, ±20ppm from -40°C to 85°C
N=±10ppm at 25°C, ±15ppm from 0°C to 70°C
P=±10ppm at 25°C, ±15ppm from -20°C to 70°C
T=±30ppm at 25°C, ±50ppm from -40°C to 125°C
PARAMETER
SPECIFICATION
Fine Leak Test
Gross Leak Test
Lead Termination
Mechanical Shock
Resistance to Soldering Heat
Resistance to Solvents
Solderability
Temperature Cycling
Vibration
MIL-STD-883, Method 1014, Condition A
MIL-STD-883, Method 1014, Condition C
Sn 2μm - 6μm
MIL-STD-202, Method 213, Condition C
MIL-STD-202, Method 210
MIL-STD-202, Method 215
MIL-STD-883, Method 2002
MIL-STD-883, Method 1010
MIL-STD-883, Method 2007, Condition A