參數(shù)資料
型號(hào): DEMO9S08LG32
廠(chǎng)商: Freescale Semiconductor
文件頁(yè)數(shù): 2/50頁(yè)
文件大?。?/td> 0K
描述: DEMO BOARD FOR LG32 FAMILY MCU
標(biāo)準(zhǔn)包裝: 1
類(lèi)型: MCU
適用于相關(guān)產(chǎn)品: MC9S08LG32
所含物品: 板,CD
相關(guān)產(chǎn)品: MC9S08LG32CLF-ND - IC MCU 8BIT LG32 FLASH 48-LQFP
MC9S08LG32CLH-ND - IC MCU 8BIT LG32 FLASH 64-LQFP
MC9S08LG32CLK-ND - IC MCU 8BIT LG32 FLASH 80-LQFP
MC9S08LG32 Series Data Sheet, Rev. 9
Electrical Characteristics
Freescale Semiconductor
10
2
Electrical Characteristics
2.1
Introduction
This section contains electrical and timing specifications for the MC9S08LG32 series of microcontrollers available at the time
of publication.
2.2
Parameter Classification
The electrical parameters shown in this supplement are guaranteed by various methods. To give the customer a better
understanding the following classification is used and the parameters are tagged accordingly in the tables where appropriate:
NOTE
The classification is shown in the column labeled “C” in the parameter tables where
appropriate.
2.3
Absolute Maximum Ratings
Absolute maximum ratings are stress ratings only, and functional operation at the maxima is not guaranteed. Stress beyond the
limits specified in Table 4 may affect device reliability or cause permanent damage to the device. For functional operating
conditions, refer to the remaining tables in this section.
This device contains circuitry that protects against damage due to high static voltage or electrical fields. However, it is advised
that normal precautions should be taken to avoid application of any voltages higher than maximum-rated voltages to this
high-impedance circuit. Reliability of operation is enhanced if unused inputs are tied to an appropriate logic voltage level (for
instance, either VSS or VDD) or the programmable pull-up resistor associated with the pin is enabled.
77
61
45
PTE3
LCD11
78
62
46
PTE2
LCD10
79
63
47
PTE1
LCD9
80
64
48
PTE0
LCD8
Table 3. Parameter Classifications
P
Those parameters are guaranteed during production testing on each individual device.
C
Those parameters are achieved by the design characterization by measuring a statistically relevant
sample size across process variations.
T
Those parameters are achieved by design characterization on a small sample size from typical devices
under typical conditions unless otherwise noted. All values shown in the typical column are within this
category.
D
Those parameters are derived mainly from simulations.
Table 2. Pin Availability by Package Pin-Count (continued)
Packages
<-- Lowest
Priority
--> Highest
80
64
48
Port Pin
Alt 1
Alt 2
Alt 3
Alt 4
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