| 型號 | 廠商 | 描述 |
| sn74abt652apw 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 |
Texas Instruments, Inc. | OCTAL REGISTERED TRANSCEIVERS WITH 3-STATE OUTPUTS |
| sn54abt652 2 3 4 5 6 7 8 9 10 |
Texas Instruments, Inc. | Octal Bus Transceivers and Registers With 3-State Outputs(八總線收發(fā)器/寄存器(三態(tài)輸出)) |
| sn54abt657a 2 3 4 5 6 7 8 9 |
Texas Instruments, Inc. | Octal Transceivers With Parity-Generators/Checkers and 3-State Outputs(八收發(fā)器(帶奇偶發(fā)生器/校驗器)) |
| sn54abt8240 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 |
Texas Instruments, Inc. | Scan Test Devices With Octal Buffers(掃描測試裝置(帶八緩沖器)) |
| sn74abt8240 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 |
Texas Instruments, Inc. | Scan Test Devices With Octal Buffers(掃描測試裝置(帶八緩沖器)) |
| sn54abt8244 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 |
Texas Instruments, Inc. | Scan Test Devices With Octal Buffers(掃描測試裝置(帶八緩沖器)) |
| sn74abt8244 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 |
Texas Instruments, Inc. | Scan Test Devices With Octal Buffers(掃描測試裝置(帶八緩沖器)) |
| sn54abt828 2 3 4 5 6 |
Texas Instruments, Inc. | 10-Bit Buffers/Drivers With 3-State Outputs(10位緩沖器/驅(qū)動器(三態(tài)輸出)) |
| sn74abt828 2 3 4 5 6 |
Texas Instruments, Inc. | 10-Bit Buffers/Drivers With 3-State Outputs(10位緩沖器/驅(qū)動器(三態(tài)輸出)) |
| sn54abt834 2 3 4 5 6 7 8 |
Texas Instruments, Inc. | 8-Bit To 9-Bit Parity Bus Transceivers(8-9奇偶總線收發(fā)器) |
| sn74abt834 2 3 4 5 6 7 8 |
Texas Instruments, Inc. | 8-Bit To 9-Bit Parity Bus Transceivers(8-9奇偶總線收發(fā)器) |
| sn54abt8373 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 |
Texas Instruments, Inc. | Scan Test Devices With Octal D-Type Latches(掃描測試裝置(帶八D鎖存器)) |
| sn74abt8373 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 |
Texas Instruments, Inc. | Scan Test Devices With Octal D-Type Latches(掃描測試裝置(帶八D鎖存器)) |
| sn54abt8374 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 |
Texas Instruments, Inc. | Scan Test Devices With Octal D-Type Edge-Triggered Flip-Flops(掃描測試裝置(帶八D邊沿觸發(fā)器)) |
| sn74abt8374 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 |
Texas Instruments, Inc. | Scan Test Devices With Octal D-Type Edge-Triggered Flip-Flops(掃描測試裝置(帶八D邊沿觸發(fā)器)) |
| sn54abt845 2 3 4 5 6 7 |
Texas Instruments, Inc. | Octal Bus Interface D-Type Latches With 3-State Outputs(八總線接口D鎖存器(三態(tài)輸出)) |
| sn74abt845 2 3 4 5 6 7 |
Texas Instruments, Inc. | Octal Bus Interface D-Type Latches With 3-State Outputs(八總線接口D觸發(fā)器(三態(tài)輸出)) |
| sn54abt8543fk 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 |
Texas Instruments, Inc. | SCAN TEST DEVICES WITH OCTAL REGISTERED BUS TRANSCEIVERS |
| sn54abt8543jt 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 |
Texas Instruments, Inc. | SCAN TEST DEVICES WITH OCTAL REGISTERED BUS TRANSCEIVERS |
| sn54abt854 2 3 4 5 6 7 8 |
Texas Instruments, Inc. | 8-Bit To 9-Bit Parity Bus Transceivers(8-9奇偶總線收發(fā)器) |
| sn74abt854 2 3 4 5 6 7 8 |
Texas Instruments, Inc. | 8-Bit To 9-Bit Parity Bus Transceivers(8-9奇偶總線收發(fā)器) |
| sn54abt862 2 3 4 |
Texas Instruments, Inc. | 10-Bit Bus Transceivers With 3-State Outputs(10位總線收發(fā)器(三態(tài)輸出)) |
| sn74abt862 2 3 4 |
Texas Instruments, Inc. | 10-Bit Bus Transceivers With 3-State Outputs(10位總線收發(fā)器(三態(tài)輸出)) |
| sn54abt8996fk 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 |
Texas Instruments, Inc. | 10-BIT ADDRESSABLE SCAN PORTS MULTIDROP-ADDRESSABLE IEEE STD 1149.1 JTAG TAP TRANSCEIVERS |
| sn54abt8996jt 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 |
Texas Instruments, Inc. | 10-BIT ADDRESSABLE SCAN PORTS MULTIDROP-ADDRESSABLE IEEE STD 1149.1 JTAG TAP TRANSCEIVERS |
| sn54abte16246 2 3 4 5 6 7 8 9 10 |
Texas Instruments, Inc. | 11-Bit Incident-Wave Switching Bus Transceivers(11位入射波開關(guān)總線收發(fā)器(三態(tài),開路集電極輸出)) |
| sn54abth162245 2 3 4 5 6 7 8 |
Texas Instruments, Inc. | 16-BIT BUS TRANSCEIVERS WITH 3-STATE OUTPUTS |
| sn74abth162245dgg 2 3 4 5 6 7 8 |
Texas Instruments, Inc. | 16-BIT BUS TRANSCEIVERS WITH 3-STATE OUTPUTS |
| sn74abth162245dgv 2 3 4 5 6 7 8 |
Texas Instruments, Inc. | 16-BIT BUS TRANSCEIVERS WITH 3-STATE OUTPUTS |
| sn54abth162245wd 2 3 4 5 6 7 8 |
Texas Instruments, Inc. | 16-BIT BUS TRANSCEIVERS WITH 3-STATE OUTPUTS |
| sn54abth162260wd 2 3 4 5 6 7 8 |
Texas Instruments, Inc. | 12-BIT TO 24-BIT MULTIPLEXED D-TYPE LATCHES WITH SERIES-DAMPING RESISTORS AND 3-STATE OUTPUTS |
| sn54abth162260 2 3 4 5 6 7 8 |
Texas Instruments, Inc. | 12-Bit to 24-Bit Multiplexed D-Type Latches(12-24多路復(fù)用D鎖存器(三態(tài)輸出)) |
| sn54abth162460 2 3 4 5 6 7 8 9 10 |
Texas Instruments, Inc. | 4-TO-1 Multiplexed/Demultiplexed Registered Transceivers(4-1多路復(fù)用/多路分解記錄收發(fā)器(三態(tài)輸出)) |
| sn74abth162460 2 3 4 5 6 7 8 9 10 |
Texas Instruments, Inc. | 4-to-1 Multiplexed/Demultiplexed Registered Transceivers(4-1多路復(fù)用/多路分解記錄收發(fā)器(三態(tài)輸出)) |
| sn54abth162500 2 3 4 5 6 7 8 9 |
Texas Instruments, Inc. | 18-Bit Universal Bus Transceivers With 3-State Outputs(18位通用總線收發(fā)器(三態(tài)輸出)) |
| sn74abth162500 2 3 4 5 6 7 8 9 |
Texas Instruments, Inc. | 18-Bit Universal Bus Transceivers With 3-State Outputs(18位通用總線收發(fā)器(三態(tài)輸出)) |
| sn54abth16260 2 3 4 5 6 7 8 |
Texas Instruments, Inc. | 12-Bit to 24-Bit Multiplexed D-Type Latches(12-24多路復(fù)用D鎖存器(三態(tài)輸出)) |
| sn54abth16460 2 3 4 5 6 7 8 9 10 |
Texas Instruments, Inc. | 4-TO-1 Multiplexed/Demultiplexed Registered Transceivers(4-1多路復(fù)用/多路分解收發(fā)器(三態(tài)輸出)) |
| sn54abth16823wd 2 3 4 5 6 7 8 9 |
Texas Instruments, Inc. | 18-BIT BUS-INTERFACE FLIP-FLOPS WITH 3-STATE OUTPUTS |
| sn74abth16823dgg 2 3 4 5 6 7 8 9 |
Texas Instruments, Inc. | 18-BIT BUS-INTERFACE FLIP-FLOPS WITH 3-STATE OUTPUTS |
| sn74abth16823dl 2 3 4 5 6 7 8 9 |
Texas Instruments, Inc. | 18-BIT BUS-INTERFACE FLIP-FLOPS WITH 3-STATE OUTPUTS |
| sn54abth16823 2 3 4 5 6 7 8 9 |
Texas Instruments, Inc. | 18-Bit Bus-Interface Flip-Flops(18位總線接口觸發(fā)器(三態(tài)輸出)) |
| sn54abth182504a 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 |
Texas Instruments, Inc. | Scan Test Devices With 20 Bit Universal Bus Transceivers(掃描檢測裝置，帶20位通用總線收發(fā)器) |
| sn54abth18504a 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 |
Texas Instruments, Inc. | Scan Test Devices With 20 Bit Universal Bus Transceivers(掃描檢測裝置，帶20位通用總線收發(fā)器) |
| sn54abth182646ahv 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 |
Texas Instruments, Inc. | SCAN TEST DEVICES WITH 18-BIT TRANSCEIVERS AND REGISTERS |
| sn54abth18646ahv 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 |
Texas Instruments, Inc. | SCAN TEST DEVICES WITH 18-BIT TRANSCEIVERS AND REGISTERS |
| sn54abth182646a 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 |
Texas Instruments, Inc. | Scan Test Devices With 18 Bit Universal Bus Transceivers( 掃描檢測裝置，帶18位收發(fā)器和寄存器) |
| sn54abth1826520a 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 |
Texas Instruments, Inc. | Scan Test Devices With 18 Bit Universal Bus Transceivers and Registers( 掃描檢測裝置，帶18位總線收發(fā)器和寄存器) |
| sn74abth1826520a 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 |
Texas Instruments, Inc. | Scan Test Devices With 18 Bit Universal Bus Transceivers And Registers( 掃描檢測裝置帶18位總線收發(fā)器和寄存器) |
| sn54abth18652a 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 |
Texas Instruments, Inc. | Scan Test Devices With 18 Bit Universal Bus Transceivers and Registers( 掃描檢測裝置，帶18位總線收發(fā)器和寄存器) |