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參數(shù)資料
| 型號： | CD40208BMS |
| 廠商： | Intersil Corporation |
| 英文描述： | CMOS 4 x 4 Multiport Register |
| 中文描述： | 的CMOS 4 × 4多端口注冊 |
| 文件頁數(shù)： | 6/11頁 |
| 文件大?。?/td> | 130K |
| 代理商： | CD40208BMS |
7-1436
Specifications CD40208BMS
Block Diagram
FIGURE 1.
TABLE 6. APPLICABLE SUBGROUPS
CONFORMANCE GROUP
MIL-STD-883
METHOD
GROUP A SUBGROUPS
READ AND RECORD
Initial Test (Pre Burn-In)
100% 5004
1, 7, 9
IDD, IOL5, IOH5A, RONDEL10
Interim Test 1 (Post Burn-In)
100% 5004
1, 7, 9
IDD, IOL5, IOH5A, RONDEL10
Interim Test 2 (Post Burn-In)
100% 5004
1, 7, 9
IDD, IOL5, IOH5A, RONDEL10
PDA (Note 1)
100% 5004
1, 7, 9, Deltas
Interim Test 3 (Post Burn-In)
100% 5004
1, 7, 9
IDD, IOL5, IOH5A, RONDEL10
PDA (Note 1)
100% 5004
1, 7, 9, Deltas
Final Test
100% 5004
2, 3, 8A, 8B, 10, 11
Group A
Sample 5005
1, 2, 3, 7, 8A, 8B, 9, 10, 11
Group B
Subgroup B-5
Sample 5005
1, 2, 3, 7, 8A, 8B, 9, 10, 11, Deltas
Subgroups 1, 2, 3, 9, 10, 11
Subgroup B-6
Sample 5005
1, 7, 9
Group D
Sample 5005
1, 2, 3, 8A, 8B, 9
Subgroups 1, 2 3
NOTE: 1. 5% Parameteric, 3% Functional; Cumulative for Static 1 and 2.
TABLE 7. TOTAL DOSE IRRADIATION
CONFORMANCE GROUPS
MIL-STD-883
METHOD
TEST
READ AND RECORD
PRE-IRRAD
POST-IRRAD
PRE-IRRAD
POST-IRRAD
Group E Subgroup 2
5005
1, 7, 9
Table 4
1, 9
Table 4
TABLE 8. BURN-IN AND IRRADIATION TEST CONNECTIONS
FUNCTION
OPEN
GROUND
VDD
9V
±
-0.5V
OSCILLATOR
50kHz
25kHz
Static Burn-In 1
(Note 1)
1, 2, 4-7, 22, 23
3, 8-21
24
Static Burn-In 2
(Note 1)
1, 2, 4-7, 22, 23
12
3, 8-11, 13-21, 24
Dynamic Burn-
In (Note 1)
12
3, 15, 16, 21, 24
1, 2, 4-7, 22, 23
8, 10, 14, 19, 20
9, 11, 13, 17, 18
Irradiation
(Note 2)
1, 2, 4-7, 22, 23
12
3, 8-11, 13-21, 24
NOTE:
1. Each pin except VDD and GND will have a series resistor of 10K
±
5%, VDD = 18V
±
0.5V
2. Each pin except VDD and GND will have a series resistor of 47K
±
5%; Group E, Subgroup 2, sample size is 4 dice/wafer, 0 failures,
VDD = 10V
±
0.5V
DEC.
Q0A
Q1A
Q2A
Q3A
D0
D1
D2
D3
DATA
INPUTS
WORD A
OUTPUT
ENABLE B
R0A R1A
DEC.
W0 W1
DEC.
R0B R1B
4 X 4
MEMORY
ENABLE A
Q0B
Q1B
Q2B
Q3B
WORD B
OUTPUT
CL
WE
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