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| 型號(hào)： | CAT1027ZD2E-30 |
| 廠商： | ON SEMICONDUCTOR |
| 元件分類： | 電源管理 |
| 英文描述： | 2-CHANNEL POWER SUPPLY MANAGEMENT CKT, DSO8 |
| 封裝： | LEAD AND HALOGEN FREE, 3 X 4.90 MM, 0.80 MM HEIGHT, MO-229, TDFN-8 |
| 文件頁(yè)數(shù)： | 14/17頁(yè) |
| 文件大?。?/td> | 103K |
| 代理商： | CAT1027ZD2E-30 |
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CAT1026, CAT1027
Doc. No. 3010, Rev. H
VOLTAGE MONITOR AND RESET CIRCUIT AC CHARACTERISTICS
Notes:
1.
Test Conditions according to “AC Test Conditions” table.
2.
Power-up, Input Reference Voltage VCC = VTH, Reset Output Reference Voltage and Load according to “AC Test Conditions” Table.
3.
Power-Down, Input Reference Voltage VCC = VTH, Reset Output Reference Voltage and Load according to “AC Test Conditions” Table.
4.
VCC Glitch Reference Voltage = VTHmin; Based on characterization data.
5.
0 < VSENSE ≤ VCC, VLOW Output Reference Voltage and Load according to “AC Test Conditions” Table.
6.
This parameter is characterized initially and after a design or process change that affects the parameter. Not 100% tested.
7.
tPUR and tPUW are the delays required from the time VCC is stable until the specified memory operation can be initiated.
8.
Latch-up protection is provided for stresses up to 100mA on input and output pins from -1 V to VCC + 1 V.
AC TEST CONDITIONS
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RELIABILITY CHARACTERISTICS
Symbol
Parameter
Reference Test Method
Min
Max
Units
NEND(6)
Endurance
MIL-STD-883, Test Method 1033
1,000,000
Cycles/Byte
TDR(6)
Data Retention
MIL-STD-883, Test Method 1008
100
Years
VZAP(6)
ESD Susceptibility
MIL-STD-883, Test Method 3015
2000
Volts
ILTH(6)(8)
Latch-Up
JEDEC Standard 17
100
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