參數(shù)資料
型號: AN78N00
廠商: Panasonic Corporation
英文描述: 3-pin Positive Output Voltage Regulator 300mA Type
中文描述: 3針正輸出電壓穩(wěn)壓器300mA的類型
文件頁數(shù): 6/9頁
文件大?。?/td> 64K
代理商: AN78N00
V
O
V
O
12.5
12.6
V
V
12
REG
IN
100
50
240
120
mV
mV
mV
mV
mA
mA
mA
μ
V
15
10
REG
L
25
10
2.8
I
bias
80
67
V
no
RR
dB
V
0.8
0.5
5
55
11.5
11.4
2
mA
mA
300
500
– 0.6
Output voltage
Output voltage tolerance
Line regulation
Load regulation
Bias current
Input bias current fluctuation
Load bias current fluctuation
Output noise voltage
Ripple rejection ratio
Minimum input/output voltage difference
Output short circuit current
Peak output current
Output voltage temperature coefficient
Parameter
Symbol
Condition
min
typ
max
Unit
V
I
=14.5 to 27V, I
O
=5 to 200mA
V
I
=14.5 to 30V, T
j
=25C
V
I
=16 to 27V, T
j
=25C
I
O
=1 to 300mA, T
j
=25C
I
O
=5 to 200mA, T
j
=25C
T
j
=25C
V
I
=14.5 to 30V, T
j
=25C
I
O
=1 to 300mA, T
j
=25C
f=10Hz to 100kHz
V
I
=15 to 25V, I
O
=50mA, f=120Hz
I
O
=300mA, T
j
=25C
V
I
=35V, T
j
=25C
T
j
=25C
I
O
=5mA, T
j
=0 to 125C
T
j
=25C
I
bias (IN)
I
bias (L)
V
DIF (min.)
I
O (Short)
I
O (Peak)
V
O
/Ta
mV/C
Note 1) The specified condition T
j
=25C means that the test should be carried out with the test time so short (within 10ms) that the
drift in characteristic value due to the rise in chip junction temperature can be ignored.
Note 2) When not specified, V
I
=19V, I
O
=100mA, C
I
=0.33
μ
F, C
O
=0.1
μ
F, T
j
=0 to 125C
I
Electrical Characteristics (Ta=25C)
·
AN78N12 (12V Type)
V
O
V
O
15.6
15.75
V
V
15
REG
IN
100
50
300
150
mV
mV
mV
mV
mA
mA
mA
μ
V
16
11
REG
L
25
10
2.8
I
bias
80
66
dB
V
0.8
0.5
5
54
14.4
14.25
2
mA
mA
300
500
– 0.8
Output voltage
Output voltage tolerance
Line regulation
Load regulation
Bias current
Input bias current fluctuation
Load bias current fluctuation
Output noise voltage
Ripple rejection ratio
Minimum input/output voltage difference
Output short circuit current
Peak output current
Output voltage temperature coefficient
Parameter
Symbol
Condition
min
typ
max
Unit
V
I
=17.5 to 20V, I
O
=5 to 200mA
V
I
=17.5 to 25V, T
j
=25C
V
I
=20 to 30V, T
j
=25C
I
O
=1 to 300mA, T
j
=25C
I
O
=5 to 200mA, T
j
=25C
T
j
=25C
V
I
=17.5 to 30V, T
j
=25C
I
O
=1 to 300mA, T
j
=25C
f=10Hz to 100kHz
V
I
=18.5 to 28.5V, I
O
=50mA, f=120Hz
I
O
=300mA, T
j
=25C
V
I
=35V, T
j
=25C
T
j
=25C
I
O
=5mA, T
j
=0 to 125C
T
j
=25C
I
bias (IN)
I
bias (L)
V
no
RR
V
DIF (min.)
I
O (Short)
I
O (Peak)
V
O
/Ta
mV/C
Note 1) The specified condition T
j
=25C means that the test should be carried out with the test time so short (within 10ms) that the
drift in characteristic value due to the rise in chip junction temperature can be ignored.
Note 2) When not specified, V
I
=23V, I
O
=100mA, C
I
=0.33
μ
F, C
O
=0.1
μ
F, T
j
=0 to 125C
·
AN78N15 (15V Type)
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