參數(shù)資料
型號: AN78LXX
廠商: Panasonic Corporation
英文描述: AB 6C 2#8,4#16 SKT RECP
中文描述: 3針正輸出電壓調(diào)節(jié)器(100毫安型)
文件頁數(shù): 3/12頁
文件大?。?/td> 179K
代理商: AN78LXX
AN78Lxx/AN78LxxM Series
3
SFF00005CEB
I
Electrical Characteristics at T
a
=
25
°
C (continued)
AN78L05, AN78L05M (5V type)
AN78L06, AN78L06M (6V type)
V
O
V
O
5.2
5.25
V
V
5
T
j
=
25
°
C
V
I
=
7.5 to 20V, I
O
=
1 to 70mA
V
I
=
7.5 to 20V, T
j
=
25
°
C
V
I
=
8 to 20V, T
j
=
25
°
C
REG
IN
150
100
mV
mV
55
45
REG
L
mV
11
I
O
=
1 to 100mA, T
j
=
25
°
C
I
O
=
1 to 40mA, T
j
=
25
°
C
T
j
=
25
°
C
V
I
=
8 to 20V, T
j
=
25
°
C
I
O
=
1 to 40mA, T
j
=
25
°
C
f
=
10Hz to 100kHz
V
I
=
8 to 18V, I
O
=
40mA, f
=
120Hz
T
j
=
25
°
C
T
j
=
25
°
C, V
I
=
35V
I
O
=
5mA, T
j
=
0 to 125
°
C
mV
mA
2
Note 1) The specified condition T
=
25
°
C means that the test should be carried out within so short a test time (within 10ms) that the
characteristic value drift due to the chip junction temperature rise can be ignored.
Note 2) Unless otherwise specified, V
I
=
10V, I
O
=
40mA, C
I
=
0.33
μ
F, C
O
=
0.1
μ
F, T
j
=
0 to 125
°
C (AN78L05) and T
j
=
0 to 100
°
C
(AN78L05M)
I
Bias
mA
I
Bias(IN)
I
Bias(L)
V
no
RR
mA
μ
V
dB
40
1
0.1
60
30
3
47
4.8
4.75
V
1.7
V
DIF(min)
I
O(Short)
V
O
/T
a
mA
140
mV/
°
C
0.65
5
57
Output voltage
Output voltage tolerance
Line regulation
Load regulation
Bias current
Bias current fluctuation to load
Output noise voltage
Ripple rejection ratio
Minimum input/output voltage difference
Output short-circuit current
Output voltage temperature coefficient
Parameter
Symbol
Conditions
Min
Typ
Max
Unit
Bias current fluctuation to input
V
O
V
O
6.24
6.3
V
V
6
T
j
=
25
°
C
V
I
=
8.5 to 21V, I
O
=
1 to 70mA
V
I
=
8.5 to 21V, T
j
=
25
°
C
V
I
=
9 to 21V, T
j
=
25
°
C
REG
IN
155
105
mV
mV
60
50
REG
L
mV
12
I
O
=
1 to 100mA, T
j
=
25
°
C
I
O
=
1 to 40mA, T
j
=
25
°
C
T
j
=
25
°
C
V
I
=
9 to 21V, T
j
=
25
°
C
I
O
=
1 to 40mA, T
j
=
25
°
C
f
=
10Hz to 100kHz
V
I
=
9 to 19V, I
O
=
40mA, f
=
120Hz
T
j
=
25
°
C
T
j
=
25
°
C, V
I
=
35V
I
O
=
5mA, T
j
=
0 to 125
°
C
mV
mA
2
Note 1) The specified condition T
j
=
25
°
C means that the test should be carried out within so short a test time (within 10ms) that the
characteristic value drift due to the chip junction temperature rise can be ignored.
Note 2) Unless otherwise specified, V
I
=
11V, I
O
=
40mA, C
I
=
0.33
μ
F, C
O
=
0.1
μ
F, T
j
=
0 to 125
°
C (AN78L06) and T
j
=
0 to 100
°
C
(AN78L06M)
I
Bias
mA
mA
μ
V
dB
50
V
no
RR
1
0.1
65
35
3
46
5.76
5.7
V
1.7
mA
140
0.7
mV/
°
C
5.5
56
I
Bias(IN)
I
Bias(L)
V
DIF(min)
I
O(Short)
V
O
/T
a
Output voltage
Output voltage tolerance
Line regulation
Load regulation
Bias current
Bias current fluctuation to input
Bias current fluctuation to load
Output noise voltage
Ripple rejection ratio
Minimum input/output voltage difference
Output short-circuit current
Output voltage temperature coefficient
Parameter
Symbol
Conditions
Min
Typ
Max
Unit
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