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參數(shù)資料
| 型號： | ADM307EARZ-REEL7 |
| 廠商： | Analog Devices, Inc. |
| 英文描述： | 3.3 V, 【15 kV ESD-Protected, Half- and Full-Duplex, RS-485/RS-422 Transceivers |
| 中文描述： | 3.3伏特，【15千伏ESD保護，半和全雙工，RS-485/RS-422收發(fā)器 |
| 文件頁數(shù)： | 16/20頁 |
| 文件大?。?/td> | 429K |
| 代理商： | ADM307EARZ-REEL7 |
ADM3070E/ADM3071E/ADM3072E/ADM3073E/ADM3074E/ADM3075E/ADM3076E/ADM3077E/ADM3078E
HOT-SWAP CAPABILITY
(ALL EXCEPT ADM3071E/ADM3074E/ADM3077E)
Hot-Swap Inputs
When a circuit board is inserted into a hot, or powered,
backplane, differential disturbances to the data bus can lead to
data errors. During this period, processor logic output drivers
are high impedance and are unable to drive the DE and RE
inputs of the RS-485 transceivers to a defined logic level.
Leakage currents up to ±10 μA from the high impedance state
of the processor logic drivers can cause standard CMOS enable
inputs of a transceiver to drift to an incorrect logic level.
Additionally, parasitic circuit board capacitance can cause
coupling of V
CC
or GND to the enable inputs. Without the hot-
swap capability, these factors can improperly enable the driver
or receiver of the transceiver. When V
CC
rises, an internal pull-
down circuit holds DE low and RE high. After the initial power-
up sequence, the pull-down circuit becomes transparent,
resetting the hot-swap tolerable input.
LINE LENGTH VS. DATA RATE
The RS-485/RS-422 standard covers line lengths up to 4000 feet.
For line lengths greater than 4000 feet, Figure 37 illustrates an
example line repeater.
±15 kV ESD PROTECTION
Two coupling methods are used for ESD testing: contact
discharge and air-gap discharge. Contact discharge calls for a
direct connection to the unit being tested. Air-gap discharge
uses a higher test voltage but does not make direct contact with
the test unit. With air-gap discharge, the discharge gun is
moved toward the unit under test, developing an arc across the
air gap, therefore the term air-gap discharge. This method is
influenced by humidity, temperature, barometric pressure,
distance, and rate of closure of the discharge gun. The contact
discharge method, while less realistic, is more repeatable and is
gaining acceptance and preference over the air-gap method.
Although very little energy is contained within an ESD pulse,
the extremely fast rise time, coupled with high voltages, can
cause failures in unprotected semiconductors. Catastrophic
destruction can occur immediately as a result of arcing or
heating. Even if catastrophic failure does not occur immediately,
the device can suffer from parametric degradation that can
result in degraded performance. The cumulative effects of
continuous exposure can eventually lead to complete failure.
Input/output lines are particularly vulnerable to ESD damage.
Simply touching or connecting an input/output cable can result
in a static discharge that damages or completely destroys the
interface product connected to the input/output port. It is
extremely important, therefore, to have high levels of ESD
protection on the input/output lines.
The ESD discharge can induce latch-up in the device under test,
so it is important that ESD testing on the input/output pins be
Rev. A | Page 16 of 20
carried out while device power is applied. This type of testing is
more representative of a real-world input/output discharge,
which occurs when equipment is operating normally.
The transmitter outputs and receiver inputs of the ADM307xE
family are characterized for protection to a ±15 kV limit using
the human body model.
HUMAN BODY MODEL
Figure 33 shows the human body model and the current
waveform it generates when discharged into a low impedance.
This model consists of a 100 pF capacitor charged to the ESD
voltage of interest, which is then discharged into the test device
through a 1.5 kΩ resistor.
100%
90%
36.8%
10%
t
RL
t
DL
I
P
TIME
t
R2
C1
R1
HIGH
VOLTAGE
GENERATOR
DEVICE
UNDER
TEST
ESD TEST METHOD
HUMAN BODY MODEL
ESD ASSOC. STD 55.1
R2
1.5k
C1
100pF
0
Figure 33. Human Body Model and Current Waveform
256 TRANSCEIVERS ON THE BUS
The standard RS-485 receiver input impedance is 12 kΩ
(1 unit load), and the standard driver can drive up to 32 unit
loads. The ADM307xE family of transceivers has an unit
load receiver input impedance (96 kΩ), allowing up to 256
transceivers to be connected in parallel on one communica-
tion line. Any combination of these devices and other RS-485
transceivers with a total of 32 unit loads or fewer can be
connected to the line.
REDUCED EMI AND REFLECTIONS
The ADM3070E/ADM3071E/ADM3072E feature reduced slew
rate drivers that minimize EMI and reduce reflections caused by
improperly terminated cables, allowing for error-free data
transmission at rates up to 250 kbps. The ADM3073E/
ADM3074E/ADM3075E offer higher driver output slew rate
limits, allowing for transmit speeds of up to 500 kbps.
相關PDF資料 |
PDF描述 |
|---|---|
| ADM307EYRZ | 3.3 V, 【15 kV ESD-Protected, Half- and Full-Duplex, RS-485/RS-422 Transceivers |
| ADM307EYRZ-REEL7 | 3.3 V, 【15 kV ESD-Protected, Half- and Full-Duplex, RS-485/RS-422 Transceivers |
| ADM3070EYRZ | 3.3 V, 【15 kV ESD-Protected, Half- and Full-Duplex, RS-485/RS-422 Transceivers |
| ADM3070EYRZ-REEL7 | 3.3 V, 【15 kV ESD-Protected, Half- and Full-Duplex, RS-485/RS-422 Transceivers |
| ADM3071E | 3.3 V, 【15 kV ESD-Protected, Half- and Full-Duplex, RS-485/RS-422 Transceivers |
相關代理商/技術參數(shù) |
參數(shù)描述 |
|---|---|
| ADM307EYRZ | 制造商:AD 制造商全稱:Analog Devices 功能描述:3.3 V, 【15 kV ESD-Protected, Half- and Full-Duplex, RS-485/RS-422 Transceivers |
| ADM307EYRZ-REEL7 | 制造商:AD 制造商全稱:Analog Devices 功能描述:3.3 V, 【15 kV ESD-Protected, Half- and Full-Duplex, RS-485/RS-422 Transceivers |
| ADM3082 | 制造商:AD 制造商全稱:Analog Devices 功能描述:High-Speed (10Mbps), Fail-Safe, RS-485/RS-422 Transceivers with Slew-Rate-Limiting and 5kV ESD Protection |
| ADM3082AN | 制造商:AD 制造商全稱:Analog Devices 功能描述:High-Speed (10Mbps), Fail-Safe, RS-485/RS-422 Transceivers with Slew-Rate-Limiting and 5kV ESD Protection |
| ADM3082AR | 制造商:AD 制造商全稱:Analog Devices 功能描述:High-Speed (10Mbps), Fail-Safe, RS-485/RS-422 Transceivers with Slew-Rate-Limiting and 5kV ESD Protection |
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