參數(shù)資料
型號(hào)： ADG509ABQ
廠商： ANALOG DEVICES INC
元件分類： 運(yùn)動(dòng)控制電子
英文描述： CMOS 4/8 CHAANNEL ANALOG MULTIPLEXERS
中文描述： 4-CHANNEL, DIFFERENTIAL MULTIPLEXER, CDIP16
封裝： CERAMIC, DIP-16
文件頁(yè)數(shù)： 2/12頁(yè)
文件大?。?/td> 170K
代理商： ADG509ABQ
REV. C
–2–
(V
DD
= +15 V
6
10%, V
SS
= –15 V
6
10%, GND = 0 V, unless otherwise noted)
B Version
–40
8
C to
+25
8
C
+85
8
C
ANALOG SWITCH
Analog Signal Range
Dual Supply
T Version
–55
8
C to
+125
8
C
Parameter
+25
8
C
Units
Test Conditions/Comments
V
SS
+ 3
V
– 1.5
350
V
SS
+ 3
V
– 1.5
400
V min
V max
typ
R
ON
300
300
–10 V < V
< +10 V, I
S
= 1 mA;
V
DD
= +15 V
±
10%, V
SS
= –15 V
±
10%
–10 V < V
< +10 V, I
S
= 1 mA;
V
DD
= +15 V
±
5%, V
SS
= –15 V
±
5%
V
S
= 0 V, I
S
= 1 mA
V
S
= 0 V, I
S
= 1 mA
400
450
max
R
ON
Drift
R
ON
Match
LEAKAGE CURRENTS
Source OFF Leakage I
S
(OFF)
0.6
5
0.6
5
%/
°
C typ
% max
±
0.02
±
1
±
0.04
±
1
±
1
±
0.04
±
1
±
1
±
0.02
±
1
±
0.04
±
1
±
1
±
0.04
±
1
±
1
nA typ
nA max
nA typ
nA max
nA max
nA typ
nA max
nA max
V
D
=
±
10 V, V
S
=
7
10 V;
Test Circuit 2
V
=
±
10 V, V
S
=
7
10 V;
Test Circuit 3
±
50
±
50
Drain OFF Leakage I
(OFF)
ADG508F/ADG528F
ADG509F
Channel ON Leakage I
D
, I
S
(ON)
ADG508F/ADG528F
ADG509F
FAULT
Output Leakage Current
(With Overvoltage)
Input Leakage Current
(With Overvoltage)
Input Leakage Current
(With Power Supplies OFF)
±
60
±
30
±
200
±
100
V
= V
=
±
10 V;
Test Circuit 4
±
60
±
30
±
200
±
100
±
0.02
±
2
±
0.005
±
2
±
0.001
±
2
±
0.02
±
2
±
0.005
±
2
±
0.001
±
2
nA typ
μ
A max
μ
A typ
μ
A max
μ
A typ
μ
A max
V
S
=
±
33 V, V
D
= 0 V, Test Circuit 3
±
2
V
S
=
±
25 V, V
D
=
7
10 V, Test Circuit 5
V
=
±
25 V, V
D
= V
EN
= A0, A1, A2 = 0 V
Test Circuit 6
DIGITAL INPUTS
Input High Voltage, V
INH
Input Low Voltage, V
INL
Input Current
I
INL
or I
INH
C
IN
DYNAMIC CHARACTERISTICS
2
t
TRANSITION
2.4
0.8
2.4
0.8
V min
V max
±
1
±
1
μ
A max
pF typ
V
IN
= 0 or V
DD
5
5
200
300
50
25
200
250
200
250
200
300
50
25
200
250
200
250
ns typ
ns max
ns typ
ns min
ns typ
ns max
ns typ
ns max
R
L
= 1 M
, C
L
= 35 pF;
V
S1
=
±
10 V, V
S8
=
7
10 V; Test Circuit 7
R
L
= 1 k
, C
= 35 pF;
V
S
= +5 V; Test Circuit 8
R
L
= 1 k
, C
L
= 35 pF;
V
S
= +5 V; Test Circuit 9
R
L
= 1 k
, C
= 35 pF;
V
S
= +5 V; Test Circuit 9
400
400
t
OPEN
10
10
t
ON
(EN,
WR
)
400
400
t
OFF
(EN,
RS
)
400
400
t
SETT
, Settling Time
0.01%
ADG528F Only
t
W
, Write Pulsewidth
t
S
, Address, Enable Setup Time
t
H
, Address, Enable Hold Time
t
, Reset Pulsewidth
Charge Injection
OFF Isolation
1
2.5
1
2.5
μ
s typ
μ
s typ
R
L
= 1 k
, C
L
= 35 pF;
V
S
= +5 V
100
120
100
10
100
100
200
100
10
100
ns min
ns min
ns min
ns min
pC typ
dB typ
dB min
pF typ
4
68
50
5
4
68
50
5
V
S
= 0 V, R
S
= 0
, C
L
= 1 nF; Test Circuit 12
R
L
= 1 k
, C
= 15 pF, f = 100 kHz;
V
S
= 7 V rms; Test Circuit 13
C
S
(OFF)
C
D
(OFF)
ADG508F/ADG528F
ADG509F
POWER REQUIREMENTS
I
DD
I
SS
50
25
50
25
pF typ
pF typ
0.1
0.1
0.2
0.1
0.1
0.1
0.2
0.1
mA max
mA max
V
IN
= 0 V or 5 V
NOTES
1
Temperature ranges are as follows: B Version: –40
°
C to +85
°
C; T Version: –55
°
C to +125
°
C.
2
Guaranteed by design, not subject to production test.
Specifications subject to change without notice.
ADG508F/ADG509F/ADG528F–SPECIFICATIONS
1
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