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參數(shù)資料
| 型號(hào)： | ADDC27012 |
| 廠商： | Analog Devices, Inc. |
| 英文描述： | 28V/100W, Dual Output,DC/DC Converters with Integral EMI Filter(雙輸出,帶積分EMI濾波器的DC-DC轉(zhuǎn)換器) |
| 中文描述： | 28V/100W，雙輸出，直流/直流轉(zhuǎn)換器與積分EMI過(guò)濾器（雙輸出，帶積分的EMI濾波器的的DC - DC轉(zhuǎn)換器） |
| 文件頁(yè)數(shù)： | 3/6頁(yè) |
| 文件大?。?/td> | 41K |
| 代理商： | ADDC27012 |
3
Preliminary Information, December 97, rev. 0
Parameter
DYNAMIC CHARACTERISTICS
7
Output voltage deviation due to step
change in load (+12V)
Output voltage deviation due to step
change in load (+15V)
Response time due to step change in
load (+12V)
Case
Temp
Test
Level
Conditions
Min
ADDC02812DA
Typ
Max
Min
ADDC02815DA
Typ
Max
Units
+25
°
C
I
Io=
±
2.08A to
±
.4.17A or
±
4.17A to
±
2.08A
Io=
±
1.67A to
±
3.34A or
±
3.34A to
±
1.67A
Io=10A to 20A or 20A to 10A,
di/dt=0.5A/
μ
S, measured to
within 2% of final value
Io=
±
1.67A to
±
3.34A or
±
3.34A to
±
1.67A,
di/dt=0.5A/
μ
S, measured to
within 2% of final value
Io=
±
.4.17A, from inhibit high
to status high
Io=
±
3.34A, from inhibit high to
status high
.850
1.30
V
+25
°
C
I
.850
1.50
V
+25
°
C
I
150
225
μ
S
Response time due to step change in
load (+15V)
+25
°
C
I
150
225
μ
S
Soft Start Turn-On Time (+12V)
+25
°
C
I
6
15
ms
Soft Start Turn-On Time (+15V)
+25
°
C
I
7
20
ms
THERMAL CHARACTERISTICS
Efficiency (+12V)
+25
°
C
Full
+25
°
C
Full
+25
°
C
Full
+25
°
C
Full
+90
°
C
+90
°
C
I
VI
I
VI
I
VI
I
VI
V
V
Io=
±
2.5A
Io=
±
.2.5A
Io=
±
.4.17A
Io=
±
.4.17A
Io=
±
2.0A
Io=
±
.2.0A
Io=
±
.3.34A
Io=
±
.3.34A
Io=
±
.4.17A
Io=
±
.3.34A
81
80
81
80
83
83
%
%
%
%
%
%
%
%
°
C
°
C
Efficiency (+15V)
81
80
81
80
83
83
Hottest Junction Temperature
8
(+12V)
Hottest Junction Temperature
8
(+15V)
CONTROL CHARACTERISTICS
Clock frequency (+12V)
Clock frequency (+15V)
Adjust (pin 3) Vadj (+12V)
Adjust (pin 3) Vadj (+15V)
Status (pin 4)
Voh
Vol
Vaux (pin 5)
Vo (nom) (+12V)
110
110
Full
Full
+25
°
C
+25
°
C
VI
VI
I
I
Io=
±
0.42A
Io=
±
0.34A
0.85
1.00
MHz
MHz
V
V
0.85
1.00
4.7
4.8
4.9
5.9
6.0
6.1
+25
°
C
+25
°
C
I
I
Ioh=400
μ
A
Iol=1 mA
2.4
4.0
0.15
0.7
2.4
4.0
0.15
0.7
V
V
+25
°
C
I
Iaux=5mA, load
current==
±
.4.17A
13.25
13.5
13.75
V
Vaux (pin 5)
Vo (nom) (+15V)
+25
°
C
I
Iaux=5mA, load
current==
±
.43.34A
13.65
13.9
14.5
V
Inhibit (pin 6)
Vil
Iil
Vi (open circuit)
Sync (pin 7)
9
Vih
Iih
Ishare (pin 8) (+12V)
Ishare (pin 8) (+15V)
Temp (pin 9)
+25
°
C
+25
°
C
+25
°
C
I
I
I
Vil=0.5V
0.5
1.2
15
0.5
1.2
15
V
mA
V
+25
°
C
+25
°
C
+25
°
C
+25
°
C
+25
°
C
I
I
I
I
Vih=7.0V
4.0
160
2.85
4.0
160
V
μ
A
V
V
V
load current==
±
.4.17A
load current==
±
.3.34A
2.65
2.75
2.65
2.75
3.90
2.85
V
3.90
NOTES
1
Absolute maximum ratings are limiting values, to be applied individually, and beyond which the serviceability of the circuit may be impaired. Functional operability
under any of these conditions is not necessarily implied. Exposure of absolute maximum rating conditions for extended periods of time may affect device reliability.
2
Military subgroups apply only to military qualified devices.
3
400Vdc upper limit rated for transient condition of up to 50 msec. 160Vdc lower limit rated for continuous operation during emergency condition. Steady state and
abnormal input voltage range require source impedance sufficient to insure input stability at low line.
4
Measured at the remote sense points.
5
Tests performed at 10W load; unit regulates output voltage to 5W load.
6
Output characteristics tested with balanced loads on each output. However, unit operates with unbalanced loads up to 90%/10% split.
7
C
load
= 0.
8
Refer to section entitled Thermal Characteristics for more information.
9
Unit has internal pull-down; refer to section entitled Pin 7 (Sync).
EXPLANATION OF TEST LEVELS
Test Level
I - 100% Production Tested.
II
- 100% production tested at +25
°
C, and sample tested at specified temperatures.
III
- Sample Tested Only.
IV - Parameter is guaranteed by design and characterization testing.
V
- Parameter is a typical value only.
VI - All devices are 100% production tested at +25°C. 100% production tested at temperature extremes for military temperature devices; guaranteed by design
and characterization testing for industrial devices
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