Positive Supply Voltage (+VS) . ." />
參數(shù)資料
型號: AD96687BPZ
廠商: Analog Devices Inc
文件頁數(shù): 3/8頁
文件大小: 0K
描述: IC COMPARATOR DUAL 2.5NS 20-PLCC
標準包裝: 49
類型: 帶鎖銷
元件數(shù): 2
輸出類型: 補充型,ECL,開路發(fā)射極
電壓 - 輸入偏移(最小值): 2mV @ -5.2V,5V
電流 - 輸入偏壓(最小值): 10µA @ -5.2V,5V
電流 - 輸出(標準): 30mA
電流 - 靜態(tài)(最大值): 18mA,36mA
CMRR, PSRR(標準): 90dB CMRR,70dB PSRR
傳輸延遲(最大): 3.5ns
工作溫度: -25°C ~ 85°C
封裝/外殼: 20-LCC(J 形引線)
安裝類型: 表面貼裝
包裝: 管件
產(chǎn)品目錄頁面: 764 (CN2011-ZH PDF)
REV. D
–3–
AD96685/AD96687
ABSOLUTE MAXIMUM RATINGS
1
Positive Supply Voltage (+VS) . . . . . . . . . . . . . . . . . . . . . 6.5 V
Negative Supply Voltage (–VS) . . . . . . . . . . . . . . . . . . . –6.5 V
Input Voltage Range
2 . . . . . . . . . . . . . . . . . . . . . . . . . . . .
±5 V
Differential Input Voltage . . . . . . . . . . . . . . . . . . . . . . . . 5.5 V
Latch Enable Voltage . . . . . . . . . . . . . . . . . . . . . . . . –VS to 0 V
Output Current . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 30 mA
Operating Temperature Range
3
AD96685BR/AD96687BQ/BR/BP . . . . . . . –25
°C to +85°C
Storage Temperature Range . . . . . . . . . . . . –55
°C to +150°C
Junction Temperature . . . . . . . . . . . . . . . . . . . . . . . . . . 175
°C
Lead Soldering Temperature (10 sec) . . . . . . . . . . . . . . 300
°C
NOTES
1Absolute maximum ratings are limiting values, may be applied individually, and
beyond which serviceability of the circuit may be impaired. Functional operation
under any of these conditions is not necessarily implied. Exposure to absolute
maximum rating conditions for extended periods may affect device reliability.
2Under no circumstances should the input voltages exceed the supply voltages.
3Typical thermal impedances . . .
AD96685 SOIC
qJA = 170
°C/W; q
JC = 60
°C/W
AD96687 Ceramic
qJA = 115
°C/W; q
JC = 57
°C/W
AD96687 SOIC
qJA = 92
°C/W; q
JC = 47
°C/W
AD96687 PLCC
qJA = 81
°C/W; q
JC = 45
°C/W
EXPLANATION OF TEST LEVELS
Test Level
I
– 100% production tested.
II – 100% production tested at 25
°C, and sample tested at
specified temperatures.
III – Sample tested only.
IV – Parameter is guaranteed by design and characterization
testing.
V – Parameter is a typical value only.
VI – All devices are 100% production tested at 25
°C; 100%
production tested at temperature extremes for extended
temperature devices; sample tested at temperature ex-
tremes for commercial/industrial devices.
FUNCTIONAL DESCRIPTION
Pin Name
Description
+VS
Positive supply terminal, nominally 5.0 V.
NONINVERTING INPUT
Noninverting analog input of the differential input stage. The NONINVERTING INPUT must be
driven in conjunction with the INVERTING INPUT.
INVERTING INPUT
Inverting analog input of the differential input stage. The INVERTING INPUT must be driven in
conjunction with the NONINVERTING INPUT.
LATCH ENABLE
In the “compare” mode (logic HIGH), the output will track changes at the input of the compara-
tor. In the “l(fā)atch” mode (logic LOW), the output will reflect the input state just prior to the
comparator being placed in the “l(fā)atch” mode. LATCH ENABLE must be driven in conjunction
with LATCH ENABLE for the AD96687.
LATCH ENABLE
In the “compare” mode (logic LOW), the output will track changes at the input of the comparator.
In the “l(fā)atch” mode (logic HIGH), the output will reflect the input state just prior to the comparator
being placed in the “l(fā)atch” mode. LATCH ENABLE must be driven in conjunction with
LATCH ENABLE for the AD96687.
–VS
Negative supply terminal, nominally –5.2 V.
Q
One of two complementary outputs. Q will be at logic HIGH if the analog voltage at the
NONINVERTING INPUT is greater than the analog voltage at the INVERTING INPUT (pro-
vided the comparator is in the “compare” mode). See LATCH ENABLE and LATCH ENABLE
(AD96687 only) for additional information.
Q
One of two complementary outputs. Q will be at logic LOW if the analog voltage at the
NONINVERTING INPUT is greater than the analog voltage at the INVERTING INPUT
(provided the comparator is in the “compare” mode). See LATCH ENABLE and LATCH ENABLE
(AD96687 only) for additional information.
GROUND 1
One of two grounds, but primarily associated with the digital ground. Both grounds should be
connected together near the comparator.
GROUND 2
One of two grounds, but primarily associated with the analog ground. Both grounds should be
connected together near the comparator.
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