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參數(shù)資料
| 型號： | AD8698ARZ-REEL7 |
| 廠商： | Analog Devices Inc |
| 文件頁數(shù)： | 16/20頁 |
| 文件大?。?/td> | 0K |
| 描述： | IC OPAMP GP R-R 1MHZ DUAL 8SOIC |
| 產(chǎn)品變化通告： | Product Discontinuance 27/Oct/2011 |
| 標準包裝： | 1,000 |
| 放大器類型： | 通用 |
| 電路數(shù)： | 2 |
| 輸出類型： | 滿擺幅 |
| 轉(zhuǎn)換速率： | 0.4 V/µs |
| 增益帶寬積： | 1MHz |
| 電流 - 輸入偏壓： | 700pA |
| 電壓 - 輸入偏移： | 20µV |
| 電流 - 電源： | 2.8mA |
| 電壓 - 電源，單路/雙路(±)： | 5 V ~ 30 V，±2.5 V ~ 15 V |
| 工作溫度： | -40°C ~ 85°C |
| 安裝類型： | 表面貼裝 |
| 封裝/外殼： | 8-SOIC（0.154"，3.90mm 寬） |
| 供應(yīng)商設(shè)備封裝： | 8-SO |
| 包裝： | 帶卷 (TR) |
AD8698
Rev. 0 | Page 5 of 20
ABSOLUTE MAXIMUM RATINGS
Table 3.
Parameter
Rating
Supply Voltage
±15 V
Input Voltage
±VS
Differential Input Voltage
±VS
Output Short-Circuit Duration
to Gnd
Indefinite
Storage Temperature Range
R, RM Packages
65°C to +150°C
Operating Temperature Range
40°C to +85°C
Junction Temperature Range
R, RM Packages
65°C to +150°C
Lead Temperature Range
(Soldering, 60 Sec)
+300°C
Stresses above those listed under Absolute Maximum Ratings
may cause permanent damage to the device. This is a stress
rating only; functional operation of the device at these or any
other conditions above those indicated in the operational
section of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect
device reliability.
THERMAL RESISTANCE
θ
JA
is specified for the worst-case conditions, i.e., θJA is specified
for devices soldered in circuit boards for surface-mount
packages.
Table 4. Thermal Resistance
Package Type
θ
JA
θ
JC
Unit
MSOP-8 (RM)
210
45
°C/W
SOIC-8 (R)
158
43
°C/W
ESD CAUTION
ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 1000 V readily accumulate on the
human body and test equipment and can discharge without detection. Although this product features
proprietary ESD protection circuitry, permanent damage may occur on devices subjected to high energy
electrostatic discharges. Therefore, proper ESD precautions are recommended to avoid performance
degradation or loss of functionality.
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