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AD775
REV. 0
–8–
AD817
1k
1k
5.6k
0V
DC
+5V
1.5V
DC
19
AD775
A
IN
1k
10
μ
F
Figure 13. Level Shifting Input Buffer
T he analog input range is set by the voltage at the top and bot-
tom of the reference ladder. In general, the larger the span
(V
RT
–V
RB
), the better the differential nonlinearity (DNL) of the
converter; a 1.8 V span is suggested as a minimum to realize
good linearity performance. AS the input voltage exceeds 2.8 V
(for AV
DD
= 4.75 V), the input circuitry may start to slightly
degrade the acquisition performance.
CLOCK INPUT
T he AD775’s internal control circuitry makes use of both clock
edges to generate on-chip timing signals. T o ensure proper
settling and linearity performance, both t
CH
and t
CL
times
should be 25 ns or greater. For sampling frequencies at or near
20 MSPS, a 50% duty cycle clock is recommended. For slower
sampling applications, the AD775 can accommodate a wider
range of duty cycles, provided each clock phase is as least 25 ns.
Under certain conditions, the AD775 can be operated at sam-
pling rates above 20 MSPS. Figure 14 shows the signal-to-noise
plus distortion (S/(N+D)) performance of a typical AD775
versus clock frequency. It is extremely important to note that
the
maximum clock rate will be a strong function of both temperature and
supply voltage.
In general, the part slows down with increasing
temperature and decreasing supply voltage.
CLOCK FREQUENCY – MHz
S
50
40
0
0.1
1
100
10
30
20
10
Figure 14. S(N + D) vs. Clock Frequency (Temperature
= +25
°
C)
A significant portion of the AD775’s power dissipation is pro-
portional to the clock frequency: Figure 15 illustrates this
tradeoff for a typical part.
CLOCK FREQUENCY – MHz
P
100
30
40
60
40
10
50
0
90
70
80
30
20
Figure 15. Power Dissipation vs. Clock Frequency
In applications sensitive to aperture jitter, the clock signal
should have a fall time of less than 3 ns. High speed CMOS
logic families (HC/HCT ) are recommended for their symmetri-
cal swing and fast rise/fall times. Care should be taken to mini-
mize the fanout and capacitive loading of the clock input line.
DIGIT AL INPUT S AND OUT PUT S
T he AD775’s digital interface uses standard CMOS, with logic
thresholds roughly midway between the supplies (DV
SS
, DV
DD
).
T he digital output is presented in straight binary format, with
full scale (1111 1111) corresponding to V
IN
= V
RT
, and zero
(0000 0000) corresponding to V
IN
= V
RB
. Excessive capacitive
loading of the digital output lines will increase the dynamic
power dissipation as well as the on-chip digital noise. Logic
fanout and parasitic capacitance on these lines should be mini-
mized for optimum noise performance.
T he data output lines may be placed in a high output impedance
state by bringing
OE
(Pin 1) to a logic high. Figure 16 indicates
typical timing for access and float delay times (t
HL
and t
DD
respectively). Note that even when the outputs are in a high
impedance state, activity on the digital bus can couple back to
the sensitive analog portions of the AD775 and corrupt conver-
sions in progress.
t
DD
t
HL
DATA ACTIVE
DATA
OUTPUT
OE
THREE-STATE
(HIGH IMPEDANCE)
t
DD
= 18ns TYPICAL
t
HL
= 12ns TYPICAL
Figure 16. High Impedance Output Timing